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Measuring circuit, measuring system and method for measuring thermal property parameters

A technology for measuring circuits and amplifying circuits, applied in the field of measuring circuits, can solve the problems of low measurement accuracy of thermal properties

Active Publication Date: 2019-07-23
NANJING UNIV
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  • Claims
  • Application Information

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Problems solved by technology

[0003] The application provides a measurement circuit, a measurement system and a method for measuring thermal physical parameters, which can improve the technical problem of low measurement accuracy of thermal physical properties caused by fundamental frequency voltage

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Embodiment Construction

[0030] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application. It should be noted that terms such as "first" and "second" are only used for distinguishing descriptions, and should not be understood as indicating or implying relative importance.

[0031] In the prior art, a metal wire deposited on the sample body is usually used as a heater at the same time, an alternating current of a certain frequency is passed through the metal wire, and then the voltage at both ends of the metal wire is measured. The measured voltage usually includes the fundamental frequency voltage and the harmonic voltage, and then based on the 3ω method, the thermal properties of the sample are measured using the harmonic voltage. The applicant found that in the actual measurement circuit, the fundamental frequency voltage at both ends of the metal wire is much greater than the final effec...

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Abstract

The present application provides a measuring circuit, a measuring system and a method for measuring thermal property parameters. The measuring circuit comprises: a first amplifying circuit, a second amplifying circuit, a differential amplifying circuit, an adjustable resistor and an electronic multiplier. At least one of the output terminals of the first amplifying circuit and the second amplifying circuit is connected to an input terminal of the differential amplifying circuit through the electronic multiplier; the adjustable resistor is used to adjust a fundamental frequency voltage difference between the two input terminals before the measurement, so that the pre-measurement fundamental frequency voltage difference is less than or equal to a first preset threshold. The electronic multiplier is used to adjust the fundamental frequency voltage of the input terminal connected to the electronic multiplier during measurement, so that the fundamental frequency voltage difference between the two input terminals of the differential amplifier is less than or equal to a second preset threshold, the second preset threshold is smaller than the first preset threshold. And the differential amplifying circuit is used to measure the fundamental frequency voltage and the third harmonic voltage, thereby improving the accuracy of the measured third harmonic voltage and improving a technical problem that low accuracy of thermal property measurement is caused by the fundamental frequency voltage.

Description

technical field [0001] The invention relates to the technical field of thermophysical property measurement, in particular to a measurement circuit, a measurement system and a method for measuring thermophysical property parameters. Background technique [0002] With the continuous development of modern technology, electronic devices have more and more diverse requirements on the operating temperature environment, and electronic devices usually need to cooperate with thermal management to ensure the normal operation of electronic devices during operation. Thermal management is related to the thermophysical properties of materials forming electronic devices. In the prior art, when measuring the thermal properties of materials, a metal wire deposited on the sample body is usually used as a heater at the same time, and an alternating current of a certain frequency is passed through the wire, and then the voltage at both ends of the wire is measured. The measured voltage usually...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N25/20
CPCG01N25/20
Inventor 卢明辉潘佳慧颜学俊狄琛芦红陈延峰
Owner NANJING UNIV
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