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Classification method and device for selecting high spectral wavelength based on single factor variance analysis

A variance analysis, single-factor technology, applied in the field of image processing and spectroscopy, can solve the problems of long time required, no use of classification information, general performance, etc., to reduce the modeling time and improve the classification accuracy.

Inactive Publication Date: 2019-07-16
INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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Problems solved by technology

[0003] Aiming at the problem of high dimensionality of near-infrared data, some researchers use PCA to select the peaks and valleys in the principal component coefficients for wavelength selection, but PCA only retains the features that contribute the most to the variance in the data set during the mapping process, and does not use any Classification information inside the data
Some researchers have also proposed the continuous projection algorithm to be used in the quantitative analysis model of near-infrared spectroscopy to study the component content of the experimental sample, and achieved good results, but the method is still in general when transferred to the qualitative analysis model.
Some researchers also use modern genetic algorithms for wavelength selection. This method continuously evaluates the performance of the classifier and selects a subset of wavelengths until convergence. Although a relatively good local solution can be obtained, it takes too long

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  • Classification method and device for selecting high spectral wavelength based on single factor variance analysis
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  • Classification method and device for selecting high spectral wavelength based on single factor variance analysis

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Embodiment 1

[0123] The origin of Ningxia wolfberry was identified by the above classification method. In this embodiment, the camera used by the hyperspectral image acquisition device is the SN3124SWIR-384 camera lens under the HySpex series. The spectral range of the hyperspectral image acquisition device is 948.72-2515.97nm, with a band interval of 5.45nm, and a total of 288 bands.

[0124]The varieties of the experimental samples used in this example are all Ningqi No. 1, and the places of origin are Jingyuan County of Gansu, Gahai Town of Qinghai, Jinghe County of Xinjiang and Tongxin County of Ningxia. 300 samples were collected from each origin, and dried and preserved in a unified way. The hyperspectral image acquisition equipment was used to collect data in three batches, and each batch collected hyperspectral images of 100 samples from each origin.

[0125] Read the hyperspectral image of the sample collected, uniformly use the reflectance value of the first band for image mani...

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Abstract

The invention provides a classification method and device for selecting hyperspectral wavelengths based on single-factor variance analysis, and belongs to the technical field of image processing and spectroscopy. The classification method for selecting the hyperspectral wavelength based on the single factor variance analysis comprises the following steps: acquiring a hyperspectral image of a to-be-classified sample; carrying out image processing on the hyperspectral image of the sample to obtain the spectral information of the sample; correcting the spectral information of the sample by adopting standard normal variable transformation; calculating the characteristic wavelength in the spectral information of the sample by adopting single-factor variance analysis; extracting the spectral information of the sample corresponding to the characteristic wavelength from the corrected spectral information of the sample; dividing spectral information of samples corresponding to the characteristic wavelengths into a training set, a verification set and a test set; obtaining a sample classifier according to the spectral information training set and the verification set of the sample; and adopting a sample classifier to classify the spectral information test set of the samples. According to the method, the classification accuracy can be improved, and the classification modeling time is shortened.

Description

technical field [0001] The invention relates to the technical fields of image processing and spectroscopy, in particular to a classification method and device for selecting hyperspectral wavelengths based on single-factor analysis of variance. Background technique [0002] In recent years, near-infrared hyperspectral image technology has been applied in sample classification. Compared with single near-infrared spectroscopy technology, it contains richer spatial information and can realize non-destructive batch collection of spectral information of non-uniform experimental samples. However, the near-infrared hyperspectral image system has a high resolution, a small band gap between different wavelengths, and has a strong correlation, and the information redundancy is very strong. Therefore, efficient spectral wavelength selection methods are an important issue of research in this field. [0003] Aiming at the problem of high dimensionality of near-infrared data, some researc...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/62
CPCG06F18/24
Inventor 覃鸿王磊李卫军徐建于丽娜林剑楚
Owner INST OF SEMICONDUCTORS - CHINESE ACAD OF SCI
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