Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An automatic flip surface detection device at the end of a scarf

An automatic flipping and surface inspection technology, which is applied in the direction of flipping objects, transportation and packaging, and optical testing for flaws/defects, can solve the problems of low detection efficiency and large labor occupation

Inactive Publication Date: 2021-09-14
SHENYANG POLYTECHNIC UNIV
View PDF9 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] To overcome the shortcomings of the existing manual inspection of the upper and lower surfaces of scarves, which takes up a lot of labor, low detection efficiency, and detection deviations, a scarf end automatic flip inspection machine is designed. With the help of related working modules, the surface quality inspection of the front and back sides of the scarf is greatly reduced. The number of workers is reduced, the production cost is reduced, the entire turning and inspection process is automated, and the efficiency and accuracy of surface quality inspection are improved.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An automatic flip surface detection device at the end of a scarf
  • An automatic flip surface detection device at the end of a scarf
  • An automatic flip surface detection device at the end of a scarf

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031] Such as figure 1 , figure 2 , image 3 , Figure 4 , Figure 5 , Figure 6 , Figure 7 , Figure 8 , Figure 9 , Figure 10 , Figure 11As shown, the automatic turning surface detection device at the end of the scarf includes a darkroom module 100, a visual detection module 200, a bottom turning axis module 300, a top turning axis module 400, and a delivery module 500. It is characterized in that: the side protection wall 102 is equipped with Darkroom door 103, side-view observation window 104, and rear-view observation window 105 are installed above the exit, top protection wall 101 is located on the upper part to close the entire turning mechanism, and front support legs 201 and rear support legs 203 fix the top cover by welding 202, the fluorescent lamps 206 are dispersed in the lower part of the top cover bracket 204 and fixed with bolts, the high-definition industrial camera 205 is fixed on the end of the top cover bracket beam through a buckle lock, and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the field of textile machinery and equipment, and relates to a scarf upper and lower surface quality detection device, in particular to a scarf end automatic flip surface detection device capable of automatically detecting the scarf upper and lower surface quality by means of machine vision. The device comprises a darkroom module, a visual detection module, a bottom turning shaft module, a top turning shaft module, and a conveying module, and is characterized in that: the darkroom protection module provides a closed darkroom environment and supports the scarf turning mechanism inside the darkroom, so The above-mentioned visual detection module completes the visual detection of the scarf, the bottom turning axis module and the top turning axis module realize the turning of the scarf, and the conveying module realizes the transmission. The present invention overcomes the defects of the existing manual detection of the upper and lower surfaces of the scarf, which takes up a lot of labor, low detection efficiency and detection deviation, greatly reduces the number of workers, realizes automation of the entire turning and detection process, and improves the quality detection efficiency and efficiency of the upper and lower surfaces of the scarf. Accuracy.

Description

technical field [0001] The invention belongs to the field of textile machinery and equipment, and relates to a scarf upper and lower surface quality detection device, in particular to a scarf end automatic flip surface detection device capable of automatically detecting the scarf upper and lower surface quality by means of machine vision. Background technique [0002] Scarves are widely used in daily life. The surface quality inspection of scarves before packaging is a labor-intensive industry. At present, most of the surface quality inspections of scarves still need to be done manually, which will inevitably lead to problems such as high labor intensity and low detection efficiency. It is the current development trend to change the detection of the upper and lower surfaces of the scarf from manual to automatic. [0003] Patent CN105600553A discloses a cloth turning device, which can turn the cloth 180° by adopting a cross pulley mechanism. The device includes a cross pulle...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/95B65H15/00
Inventor 徐博闻郭忠峰秦智超王婷婷杨林
Owner SHENYANG POLYTECHNIC UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products