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In-machine test method, in-machine test device, terminal device and storage medium

A testing method and testing equipment technology, applied in the testing field, can solve the problems of long development cycle, low reliability and high cost, and achieve the effect of improving performance, improving reliability and reducing production cost

Active Publication Date: 2019-05-21
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0003] However, the systematic tests currently used are all tested by external equipment test systems. The above-mentioned technical solutions have technical problems such as high cost, long development cycle, and low reliability.

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  • In-machine test method, in-machine test device, terminal device and storage medium
  • In-machine test method, in-machine test device, terminal device and storage medium
  • In-machine test method, in-machine test device, terminal device and storage medium

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Embodiment Construction

[0031] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

[0032] In order to illustrate the technical solutions described in this application, specific examples are used below to illustrate. In this embodiment, the application of the in-machine test method in the terminal equipment photoelectric theodolite is taken as an example for introduction. as attached figure 1 As shown, when implementing S11 to detect the running state of the equip...

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Abstract

The invention is applicable to the technical field of in-machine testing, and provides an in-machine testing method and device, a terminal device and a storage medium. The method comprises: performingcomparative analysis on the detected signal fed back by the running state and a preset characteristic parameter of the equipment to judge whether the signal is normal or not; when it is judged that the fault occurs, a preset fault mode is output, and fault isolation is conducted on the fault mode; and when the judgment is normal, the detection of the operation state of the next equipment is sequentially executed. According to the method, the built-in test is adopted, external equipment is not needed, and the test method is operated through the built-in processor, so that the testability design of the system is developed in parallel when the system is developed, and the cost is reduced; The development period is shortened; The overall performance is improved, and efficient system reliability is improved.

Description

technical field [0001] The present application belongs to the technical field of testing, and in particular relates to an in-machine testing method, a testing device, terminal equipment and a storage medium. Background technique [0002] Photoelectric tracking equipment is mainly composed of tracking turntable, servo control system, visible imaging tracker, infrared imaging tracker, angle measurement system, main control system, timing positioning equipment, orientation equipment, power distribution management system, etc. With the improvement of the performance and complexity of the vehicle-mounted optoelectronic tracking equipment, it is urgent to carry out system test design in parallel with the system design, so as to improve the fault diagnosis and isolation level of the vehicle-mounted optoelectronic tracking equipment. [0003] However, the systematic tests currently adopted all use external equipment test systems for testing, and the above-mentioned technical solutio...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 王鹤淇薛乐堂王伟国姜润强刘阳刘廷霞杜璧秀
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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