Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A defect detection method based on local contrast saliency region detection

A technology of local contrast and area detection, which is applied in computer parts, image data processing, instruments, etc., can solve problems such as inability to adjust in time, waste, and edge extraction algorithm cannot accurately extract edges, etc., so as to avoid untimely inspection Effect

Inactive Publication Date: 2019-04-09
南京敏光视觉智能科技有限公司
View PDF0 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, the commonly used printing defect detection methods usually use the edge extraction algorithm based on the glass cover image, and then analyze the contour and the flatness and concave-convex area of ​​the edge, but the existing technology is still unable to detect subtle defects, because in the subtle Near the defect, the commonly used edge extraction algorithm cannot accurately extract the edge
[0005] In addition, the existing process uses manual visual inspection during the final inspection, which cannot effectively prevent damage to the glass cover caused by machine failure or damage. From the first occurrence of damage to manual detection during the final inspection, a series of The damaged parts cannot be adjusted in time, resulting in loss and waste of the manufacturer

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A defect detection method based on local contrast saliency region detection

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0025] Below in conjunction with accompanying drawing and specific embodiment, further illustrate the present invention, should be understood that these examples are only for illustrating the present invention and are not intended to limit the scope of the present invention, after having read the present invention, those skilled in the art will understand various aspects of the present invention All modifications of the valence form fall within the scope defined by the appended claims of the present application.

[0026] like figure 1 Shown is a defect detection method based on local contrast salient region detection, which includes the following steps: Step 1) Collect panel images, and divide the images into several regions with a graph-based segmentation method;

[0027] Step 2) establishes a color histogram for each region;

[0028] Step 3) Calculate the color distance metric Dr(rk, ri) of the two regions rk and ri;

[0029] Step 4) For each region rk, calculate its signi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a defect detection method based on local contrast saliency region detection, which comprises the following steps: acquiring a panel image, and dividing the image into a plurality of regions by using a graph-based segmentation method; Establishing a color histogram for each region; Calculating the color distance metrics of the two areas rk and ri; For each region rk, calculating the saliency value of the region rk by measuring the color contrast of the region rk and other regions of the image, namely, calculating the weighted color distance measurement sum of the regionrk, and obtaining a sparse histogram; introducing Spatial information i to increase the influence effect of the area, and defining the significance based on the contrast of the spatial weighted area as the spatial distance between negative distance power weighted areas of an exponential function; setting a saliency threshold value, and if the saliency threshold value is larger than the threshold value, the human eyes are visually sensitive to the saliency threshold value and are very likely slits; if the saliency threshold value is less than the threshold, the region does not have significanceand is impossible to be a slit region.

Description

technical field [0001] The invention relates to the technical field of defect detection, in particular to a defect detection method based on local contrast significant region detection. Background technique [0002] With the continuous improvement of people's living standards and the continuous popularization of electronic equipment, the production and shipment of electronic equipment is very large. How to realize the automatic detection of defects in the production process of electronic equipment products has become one of the concerns of major manufacturers. [0003] Among them, there are many steps in the production process of the glass cover plate of electronic equipment, there are many problems, and there is a lot of room for improvement. The main problems are: [0004] At present, the commonly used printing defect detection methods usually use the edge extraction algorithm based on the glass cover image, and then analyze the contour and the flatness and concave-convex ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/11G06K9/46
CPCG06T7/0004G06T7/11G06T2207/30108G06T2207/30168G06V10/40G06V10/467G06V10/56G06V10/50
Inventor 欧阳光池敏
Owner 南京敏光视觉智能科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products