An improved z-scan device

Abstract

The invention discloses an improved Z-scanning apparatus, wherein different to-be-measured samples are pre-scanned so as to automatically determine the optimum measurement light intensity corresponding to the to-be-measured samples; at the optimum measurement light intensity, the following problems are effectively avoided: 1) influence of high-order non-linear optics effect due to excessive lightintensity; and 2) influence caused by excessive noise signals due to weakness of the light intensity; therefore, the measurement result is accurate and reliable. In the apparatus, a plurality of reflectors and aperture diaphragms are arranged for shaping the beam. In the apparatus, corresponding devices are added to measure influences, caused by laser energy fluctuation, instable laser mold locking and sample breaking, during the measurement; and corresponding devices are added to avoid influence of thermal effects and polarization state during the measurement. On the mentioned basis, the incident light source is replaceable, the polarization state is adjustable, and closed pore and opened core data can be measured at the same time.

Description

technical field [0001] The invention relates to an improved Z scanning device, which belongs to the field of nonlinear optics and optical detection. Background technique [0002] The third-order optical nonlinearity of the material makes the refractive index and absorption coefficient no longer linearly proportional to the light intensity. Using this special property, two-photon spectroscopy, high-resolution fluorescence microscopy, photodynamic therapy, up-conversion laser, and micro-nano manufacturing can be realized. , 3D optical data storage, optical limiting and many other applications. It has made great progress in recent decades. Especially in recent years, the emergence of new technologies and applications based on nonlinear optics has greatly promoted the development of this field. Using the nonlinear effect of materials, the measurement of nonlinear optical parameters is very critical. Traditional methods for measuring optical nonlinearity include nonlinear inte...

AI Technical Summary

Problems solved by technology

How to automatically and quickly determine the optimal incident light intensity has not been mentioned in the prior art

At the same time, because the Z-scan technology is limited to measuring the energy change of the projected sample, it cannot accurately distinguish whether only the third-order nonlinear refraction and third-order nonlinear absorption processes have occurred in the sample.

Images