In-situ tensile experiment device for scanning electron microscope
A technology of in-situ stretching and scanning electron microscopy, applied to measuring devices, using stable tension/pressure to test material strength, instruments, etc., can solve the problems of less experimental data and inconvenient use
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[0014] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.
[0015]The in-situ tensile test device for the scanning electron microscope, as shown in the figure, includes a base 1, the four corners of the top surface of the base 1 are respectively fixed with vertical lifting rods 2, and the tops of the four lifting rods 2 are fixedly connected by a square block 3 , the square block 3 and the base 1 are paral...
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