CTLS-based external radiation source radar net bistatic distance error registration method
A technology of external radiation source radar and external radiation source, which is applied in the field of dual-base distance error registration of external radiation source radar network based on constrained total least squares, can solve the problem of ignoring noise structure and correlation, and failing to achieve the minimum system deviation Optimal estimation and other issues, to achieve good estimation performance, reduce complexity, and accurate system error estimation
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0021] The present invention is based on a CTLS-based double-base distance error registration method for the radar network of the external radiation source. In the radar network system of the external radiation source, the double-base distance information obtained by the receiving station is used to perform system error registration. The method includes the following steps:
[0022] Step 1: In the multi-transmission and single-receiver external radiation source radar network, it includes M external radiation sources and a receiving station, and uses the receiving station to receive measurements of multiple targets to obtain dual-base distance information
[0023]
[0024] Among them, u m,p Indicates the bistatic distance measured by the external radiation source radar system composed of the transmitting source m and the receiving station to the target p; the receiving station is located at the origin (0,0), the number of transmitting sources is M, and the coordinate vector o...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com