OLED substrate recognition system and method

Abstract

The invention discloses an OLED substrate recognition system. The system comprises a host controller, a serial data bus and at least one substrate. The host controller, the serial data bus and the atleast one substrate form a substrate link, wherein the The host controller reads substrate link information through the serial data bus and reads substrate configuration information of the at least one substrate on the substrate link through the serial data bus according to the substrate link information, comparing the configuration information of each substrate with the substrate configuration information preset in the host controller, and outputting results. The embodiment of the invention provides the OLED substrate recognition system and method, on-line identification of a link substrate for driving an OLED panel can be achieved, and an invalid test caused by a mismatch between the substrate and a test program during an OLED panel test process and the damage of the substrate or the panel to be tested caused by a false test are avoided, so that panel test efficiency is improved.

Description

technical field [0001] The invention relates to the field of display technology, in particular to an OLED substrate identification system and method. Background technique [0002] In the current organic light-emitting diode (Organic Light-Emitting Diode, OLED) panel inspection, in order to meet the requirements of generalization and modularization, the screen and timing generation part are usually designed as a general-purpose host, leaving high-density connectors as external Interface, according to the test requirements of different types, interface types, timing, electrical parameters and other test requirements of the OLED panel to be tested, use different host programs, and replace the corresponding type of ROM substrate to generate corresponding driving signals. Connect the substrate, etc., to the OLED panel to be tested for panel testing. [0003] With the increase in the types of OLED panels tested, more and more types of ROM substrates and extension substrates are u...

AI Technical Summary

Problems solved by technology

[0004] At the inspection site, when the type of OLED panel to be inspected is frequently switched, sometimes due to various factors above, the substrate or program is accidentally misused, resulting in a mismatch between the host program and the external substrate type, and the output of the main program is a substrate operation. However, the actual connection is another substrate, the output result is unpredictable, the panel detection is abnormal, and sometimes even the substrate and the panel to be tested are damaged.

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