Embedded fault diagnosis method based on correlation matrix

Abstract

The invention provides an embedded fault diagnosis method based on a correlation matrix. The embedded fault diagnosis method comprises the steps of: step 1, establishing a correlation model, and optimizing a D matrix of the correlation model; step 2, judging whether failure patterns are failures bound to occur, possible failures, or failures certainly not going to occur; step 3, judging whether isolation units are isolation units bound to fail, isolation units possibly fail, or isolation units certainly not going to fail; step 4, and deploying a diagnostic strategy. By using the embedded faultdiagnosis method, all failure patterns of a product can be diagnosed and the faulty isolation units are isolated within a short time. Through implementing diagnosis and isolation of product failuresby adopting the embedded fault diagnosis method, the diagnosis of the failure patterns can be realized based on the correlation matrix obtained through a testability model, and the generated diagnostic strategy can be deployed to the operation process of the actual product.

Description

technical field [0001] The invention relates to the field of test methods, in particular to an embedded fault diagnosis method based on a correlation matrix. Background technique [0002] The concept of testable design of products was proposed as early as the Cherry Hill Test Conference in 1970. By the mid-1970s, due to the development of integrated circuit design, the necessity of testable design was gradually recognized and valued by people. With more and more papers and research results related to design for test, design for test has become an important part in the field of integrated circuit testing. An important method to accurately measure and evaluate the testability design level of products is testability modeling, which refers to the use of standardized forms to isolate units, signals, failure modes, failure rates, tests, and the relationship between them describe the process. After using this method to describe and express the testable design of the system, it is...

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Problems solved by technology

[0004] However, there are still two problems in the diagnostic isolation tree based on the correlation matrix: one is that it only supports the occurrence of a single fault, and does not support the diagnostic isolation when multiple faults coexist

This is because a basic assumption of testability modeling is that a single fault occurs, and the correlation matrix is ​​generated on this premise, so the diagnosis and isolation tree can only be used for diagnosis and isolation when a single fault occurs, but in many cases it is Multiple faults coexist, which leads to limited application scenarios for diagnosing isolation trees;

The testability design verification evaluation based on the testability model mainly faces two problems: first, how to realize the diagnosis of failure modes based on the correlation matrix obtained from the testability model; second, the interaction between the generated diagnosis strategy and the actual product operation process out of touch

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