Software defect statistical processing method and device

A software defect, statistical processing technology, applied in the computer field, can solve problems such as the low value of bug data, the lack of bug classification indicators, the root cause, and the unclear direction of improvement, etc., to achieve the effect of saving manpower investment.

Active Publication Date: 2018-04-13
KE COM (BEIJING) TECHNOLOGY CO LTD
View PDF7 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] For the development and testing process of software R&D projects, there is currently a lack of clear classification indicators for bugs. Data statistics are all relying on manual work, and can only be obtained through manual queries. Disadvantages such as unintuitive process data display, team members are not clear about the root cause of bugs and the direction of improvement, which seriously affects the progress of software project development and testing

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Software defect statistical processing method and device
  • Software defect statistical processing method and device
  • Software defect statistical processing method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0037] The specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings. The following examples are only used to illustrate the technical solution of the present invention more clearly, but not to limit the protection scope of the present invention.

[0038] figure 1 It shows a schematic flowchart of a software defect statistical processing method provided in this embodiment, including:

[0039] S101. Obtain target attribute information of target software defects in the software development process, and divide the target software defects into corresponding data sets according to the target attribute information.

[0040] Wherein, the target software defect is a currently acquired software defect in the software development process.

[0041] The target attribute information is the attribute information of the target software defect, such as defect classification, defect source, responsible role and responsible per...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

Embodiments of the invention disclose a software defect statistical processing method and device. The method comprises the following steps of: obtaining target attribute information of a target software defect in a software research and development process, and dividing the target software defect into a corresponding data set according to the target attribute information; carrying out statistics on software defects in each data set according to a preset period and a preset statement form so as to obtain defect statistical results; and sending the defect statistical results to a display to carry out display. According to the method and device, attribute information of software defects are dividing into data sets, and statistics and display are carried out on the software defects in the datasets according to preset periods and preset statement formats, so that data analysis, statistics, calculation and display of defects in software research and development can be automatically realizedwithout artificial participation, thereby greatly saving the manpower investment and providing data support for data measurement and project summary of software defects.

Description

technical field [0001] The embodiments of the present invention relate to the field of computer technology, and in particular to a software defect statistical processing method and device. Background technique [0002] At present, various types of bugs (bugs) will occur in various stages and roles in software development, such as browser compatibility, security, business function bugs, etc., and there are many stages, personnel and numbers. [0003] For the development and testing process of software R&D projects, there is currently a lack of clear classification indicators for bugs, and data statistics are all relying on manual, and can only be obtained through manual query, which brings bug data of little value, manual analysis consumes a lot of manpower, The process data display is not intuitive, and team members are not clear about the root cause of bugs and the direction of improvement, which seriously affects the progress of software project development and testing. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36G06Q10/10
CPCG06F11/3692G06Q10/103
Inventor 吕冬冬史晓强
Owner KE COM (BEIJING) TECHNOLOGY CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products