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Detection device and detection method for array substrate row drive circuit

A technology of array substrate row and detection device, which is applied in power test, static indicator, instrument, etc., can solve the problem of increasing the difficulty of abnormal analysis, unable to further determine the abnormal row drive unit, etc., and shorten the investigation and repair time. , the effect of improving efficiency

Active Publication Date: 2017-05-31
WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The defect of the detection device of the row drive circuit of the array substrate in the prior art is that the detection device can only reflect the overall abnormality of the row drive circuit of the array substrate, but cannot further determine the abnormal row drive unit, thus increasing the analysis of the abnormality. difficulty

Method used

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  • Detection device and detection method for array substrate row drive circuit
  • Detection device and detection method for array substrate row drive circuit
  • Detection device and detection method for array substrate row drive circuit

Examples

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no. 1 example

[0056] Generally speaking, the row driving circuit of the left array substrate and the row driving circuit of the right array substrate are detected separately. The detection method used is the same. Therefore, the detection of the row driving circuit of the left array substrate is taken as an example for description below.

[0057] image 3 It is a schematic structural diagram of a detection device of the row driving circuit of the array substrate (here, the row driving circuit of the left array substrate, referred to as the row driving circuit) according to the first embodiment of the present invention. Such as image 3 As shown, the detection device mainly includes an input module 301 , an acquisition module 302 and a detection module 303 .

[0058] Specifically, the input module 301 is connected to the input terminal of the first-stage row driving unit of the row driving circuit 304 , and is used for inputting a test signal to the first-stage row driving unit of the row...

no. 2 example

[0067] This embodiment further optimizes the structure of the detection module 303 in the first embodiment.

[0068] Figure 4 is a schematic structural diagram of the detection module 303 according to the second embodiment of the present invention. Such as Figure 4 As shown, the detection module 303 of this embodiment may include a superposition unit 30 , a determination unit 40 and a plurality of conversion units 20 . Wherein, each conversion unit 20 is connected with the acquisition module 302 . And, each converting unit 20 corresponds to a row driving unit of one level, and is used for converting the output signal of the row driving unit of the level obtained by the acquisition module 302 into a pulse signal, and making the pulse signal correspond to the pulse of other row driving units. The signals do not overlap each other. The superposition unit 30 is respectively connected to each conversion unit 20, and is used for superimposing the pulse signals output by all co...

no. 3 example

[0078] Based on the same inventive concept, an embodiment of the present invention also provides a detection method for the array substrate row driving circuit 304 . Likewise, this embodiment still takes the row driving circuit 304 of the left array substrate as an example for illustration.

[0079] Figure 6 It is a schematic flowchart of the detection method of the array substrate row driving circuit 304 according to the third embodiment of the present invention. Such as Figure 6 As shown, the detection method may include the following steps S610, S620 and S630.

[0080] In step S610 , a test signal is input to the first-stage row driving unit of the row driving circuit 304 . Here, the row driving circuit 304 includes a plurality of cascaded row driving units.

[0081] In step S620, output signals of each row driving unit are acquired.

[0082] In step S630, when it is judged that the row driving circuit 304 is working abnormally, the abnormally working row driving uni...

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Abstract

The invention discloses a detection device and a detection method for an array substrate row drive circuit. The detection device comprises an input module, an acquisition module and a detection module. The input module is used for inputting a test signal to a first-stage row drive unit of a the row drive circuit. The row drive circuit comprises a plurality of row drive units in cascading. The acquisition module is used for acquiring output signals of row drive units. The detection module is used for determining the abnormal row drive units according to the output signals of the row drive units when judging out abnormal running of the row drive circuit. The detection device and the detection method can judge out positions of the row drive units in abnormal running to improve exception detection and analysis efficiency of the row drive units.

Description

technical field [0001] The present invention relates to the technical field of detection of display panels, in particular to a detection device and method for a row driving circuit of an array substrate. Background technique [0002] In recent years, LTPS (Low Temperature Poly-Silicon, low-temperature polysilicon) technology has been widely used in higher-end mobile phones and tablet products. Due to the advantages of low power consumption, high response rate, and high aperture ratio, LTPS technology has become one of the indispensable and important technologies in the process of developing high PPI (pixels per inch, the number of pixels per inch) products. In order to improve production efficiency and production yield, it is essential to monitor and inspect the manufacturing process and semi-finished products of LTPS products. [0003] At present, the inspection mechanism of the low-temperature polysilicon product process mainly includes electrical inspection and optical i...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G09G3/00
CPCG09G3/006G09G3/3266G09G3/3677G09G2310/0202G09G2310/0267G09G2230/00G01R31/40G09G3/20
Inventor 高天华
Owner WUHAN CHINA STAR OPTOELECTRONICS TECH CO LTD
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