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Multi-dimension measurement method and device for test adequacy

A measurement method and adequacy technology, applied in the field of multi-dimensional measurement methods and devices for test adequacy, can solve problems such as insufficient test set and inability to know the adequacy criterion of branch coverage

Active Publication Date: 2017-01-04
BEIHANG UNIV
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Problems solved by technology

For example, a test set with a statement coverage of 100% is sufficient from the perspective of statement coverage, that is to say, the test set is sufficient for the statement coverage adequacy criterion, but it is impossible to know whether it is sufficient for the branch coverage adequacy criterion. full
But we can be sure that if the test set is not sufficient in one aspect, such as branch coverage, then the test set is not sufficient

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  • Multi-dimension measurement method and device for test adequacy

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Embodiment Construction

[0047]Preferred embodiments of the present invention will be specifically described below in conjunction with the accompanying drawings, wherein the accompanying drawings constitute a part of the application and are used together with the embodiments of the present invention to explain the principle of the present invention.

[0048] Firstly, the method described in the embodiment of the present invention will be described in detail with reference to the accompanying drawings.

[0049] Design a test adequacy measurement in six dimensions from the perspectives of code coverage, the structure of the software under test, the distribution of test cases, the distribution of test failures, the change of test cases in different stages, and the change of failures in different test stages, including software Code coverage of modules, weighted code coverage based on software module complexity, number of weighted test cases based on software module complexity, coverage of test case sequen...

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Abstract

The invention relates to a multi-dimension measurement method and device for test adequacy. The method includes the steps that a test adequacy measurement model is established through a computer; all measures of software to be measured are calculated according to the test adequacy measurement model, wherein the measures at least include one or more of code coverage rate distribution of a software module, demanded process coverage rate distribution, complexity weighted code coverage rate distribution, complexity weighted test case number distribution, test case updating proportion distribution of a certain stage and newly-increased failure number distribution of the corresponding stage. According to the multi-dimension measurement method and device for test adequacy, by carrying out multi-dimension comprehensive measurement on test adequacy from multiple perspectives instead of adopting a numerical value measurement method to evaluate test adequacy, test data information is more subjectively utilized to evaluate test adequacy, and higher persuasion and interpretability are achieved.

Description

technical field [0001] The invention relates to the field of software technology, in particular to a multi-dimensional measurement method and device for test adequacy. Background technique [0002] Ideally, software testing should test all possible inputs in the input space to catch all bugs, but this is almost impossible to achieve. For finite input sets, if the set size is large, the test resources consumed to test all input data are unaffordable; for infinite input sets, this is impossible. Therefore, it is unrealistic for software testing to eliminate all errors in software. However, how to judge that a test has sufficiently verified the software is the problem that arises from this. If the test is "sufficient", it means that the test has checked all possible states in the software as far as possible. [0003] The adequacy of software testing was first proposed by Goodenough and Gerhert in 1975, which refers to whether the performance of software on a limited data set...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3672G06F11/3676
Inventor 吴际鲍力杨海燕刘超
Owner BEIHANG UNIV
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