Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Memory monitoring method and apparatus

A memory and memory bar technology, applied in the computer field, can solve problems such as system crashes, affecting system stability, memory error handling, etc., and achieve the effect of improving stability

Active Publication Date: 2016-09-28
LANGCHAO ELECTRONIC INFORMATION IND CO LTD
View PDF3 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In the prior art, when the memory is monitored, the memory error cannot be processed after the memory error is detected, and the memory error will exist in the system. When there are many memory errors, it will seriously affect the stability of the system and easily lead to system breakdown
[0004] It can be seen from the above description that the existing technology cannot handle memory errors, which makes the system less stable

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Memory monitoring method and apparatus
  • Memory monitoring method and apparatus
  • Memory monitoring method and apparatus

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0047] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments It is a part of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative work belong to the protection of the present invention. scope.

[0048] Such as figure 1 As shown, the embodiment of the present invention provides a method for monitoring memory, the method may include the following steps:

[0049] S1: Detecting the memory to determine a memory error in the memory;

[0050] S2: Determining repairable memory errors from all memory errors;

[0051] S3: Mask the memory region corres...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a memory monitoring method and apparatus. The method comprises the steps of S1: detecting a memory to determine memory errors in the memory; S2: determining a repairable memory error from all the memory errors; and S3: shielding a memory region corresponding to the repairable memory error. According to the memory monitoring method and apparatus, the stability of a system where the memory is located can be improved.

Description

technical field [0001] The invention relates to the technical field of computers, in particular to a method and device for monitoring memory. Background technique [0002] Memory is one of the important components in the computer, it is a bridge to communicate with the CPU. All programs in the computer run in the memory, so the performance of the memory has a great impact on the computer. How to monitor the memory to ensure the normal operation of the memory is very important. [0003] In the prior art, when the memory is monitored, the memory error cannot be processed after the memory error is detected, and the memory error will exist in the system. When there are many memory errors, it will seriously affect the stability of the system and easily lead to system breakdown. [0004] It can be seen from the above description that the prior art has low stability of the system due to the inability to handle memory errors. Contents of the invention [0005] The embodiment o...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30G06F11/16
CPCG06F11/1666G06F11/3037
Inventor 姜庆臣
Owner LANGCHAO ELECTRONIC INFORMATION IND CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products