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Wheat Molecular Markers and Their Application in Identification of Wheat Yield-related Traits

A technology for yield-related traits and molecular markers, which can be used in the determination/inspection of microorganisms, biochemical equipment and methods, DNA/RNA fragments, etc.

Inactive Publication Date: 2019-04-05
INST OF CROP SCI CHINESE ACAD OF AGRI SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Conventional breeding usually carries out phenotypic selection. Although great progress has been made, it is time-consuming and labor-intensive. In comparison, the molecular marker-assisted breeding strategy is relatively simple and can efficiently utilize excellent genes, thereby significantly speeding up the breeding process

Method used

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  • Wheat Molecular Markers and Their Application in Identification of Wheat Yield-related Traits
  • Wheat Molecular Markers and Their Application in Identification of Wheat Yield-related Traits
  • Wheat Molecular Markers and Their Application in Identification of Wheat Yield-related Traits

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Embodiment 1

[0065] Example 1, CAPS-7A is related to wheat yield-related traits

[0066] 1. Discovery of CAPS-7A

[0067] The inventor of the present invention has discovered a wheat molecular marker related to wheat yield according to 32 common hexaploid wheat varieties in Table 1 (from the National Germplasm Resource Bank, the public can obtain from the National Germplasm Resource Bank), and put it Named CAPS-7A, the CAPS-7A is a PCR product obtained by using wheat genomic DNA as a template and using primers to perform PCR amplification of P. There are three sequences in different wheat varieties, sequence 1, sequence 2 and sequence 3. Primer pair P consists of single-stranded DNA named p1 and p2, p1 is the single-stranded DNA shown in sequence 4 (5'-AGTCTATACCCCACACCCCATC-3'), and p2 is shown in sequence 5 (5'-GCATTGAGTAGTGTTTTGTGCTGT-3') of single-stranded DNA.

[0068] The wheat whose PCR product sequence is sequence 1 is named A1A1 genotype wheat; the wheat whose PCR product sequen...

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Abstract

The invention discloses a wheat molecular marker and application thereof in identifying wheat yield related traits. According to the wheat molecular marker, a primer pair P is utilized to perform amplification by using wheat genome DNA (deoxyribonucleic acid) as a template to obtain DNA molecules. The primer pair P is composed of single-stranded DNAs p1 and p2, wherein the p1 is a single-stranded DNA which is specifically combined with the forward 70th site disclosed as Sequence 1 in the wheat genome DNA, and the p2 is a single-stranded DNA which is specifically combined with the reverse 241st site disclosed as Sequence 1 in the wheat genome DNA. The wheat is subjected to genotyping according to the wheat molecular marker to obtain the three homozygous genotypes A1A1, A2A2 and A3A3. The experiment proves that the genotypes A1A1, A2A2 and A3A3 of the wheat are related to wheat yield related traits-number of spikelets per spike, number of ears per plant and weight of thousand grains, and can be used for culturing high-yield wheat species.

Description

technical field [0001] The invention relates to wheat molecular markers in the field of biotechnology and their application in identifying wheat yield-related traits. Background technique [0002] Wheat (Triticum aestivum L.) is one of the most important food crops in the world, and its safe production is an important guarantee for human food security. The economical and effective way of breeding high-yielding wheat varieties has extremely important strategic significance for the safety of human food production. Conventional breeding usually carries out phenotypic selection. Although great progress has been made, it is time-consuming and labor-intensive. In comparison, the molecular marker-assisted breeding strategy is relatively simple and can efficiently utilize excellent genes, thereby significantly speeding up the breeding process. Contents of the invention [0003] The technical problem to be solved by the present invention is how to identify wheat yield-related trai...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C12Q1/6895C12N15/11
CPCC12Q1/6895C12Q2600/13
Inventor 景蕊莲徐伟娜张斌刘霞昌小平
Owner INST OF CROP SCI CHINESE ACAD OF AGRI SCI
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