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Edge defect detection method and apparatus

A technology of edge defect and detection method, which is applied in the field of image processing, can solve the problems of poor detection accuracy and low efficiency of edge defect, and achieve the effect of improving accuracy and avoiding the decline of detection efficiency

Active Publication Date: 2016-02-17
BEIJING LUSTER LIGHTTECH
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AI Technical Summary

Problems solved by technology

[0005] The embodiment of the present invention provides an edge defect detection method and device to solve the problems of poor detection accuracy and low efficiency of edge defects in the prior art

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  • Edge defect detection method and apparatus
  • Edge defect detection method and apparatus

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Embodiment Construction

[0067] In order to enable those skilled in the art to better understand the technical solutions in the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described The embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0068] In the traditional industrial production process, the quality inspection of industrial products mainly focuses on whether the length, width and other dimensions of industrial products meet the standard technical specifications, and checks whether there are obvious deformations or defects on the surface of industrial products. Wit...

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Abstract

Embodiments of the invention disclose an edge defect detection method and apparatus. The method comprises: according to an image of a to-be-detected object shot by a shooting device, obtaining edge points of the to-be-detected object; scoring the edge points, and determining a fitted edge point and a candidate edge point according to values of scores; fitting the fitted edge point to obtain a fitted edge of the to-be-detected object; computing the distance between the candidate edge point and the fitted edge, and if the distance is greater than a defect threshold distance, indicating that the candidate edge point is a defective edge point; and according to the defective edge point, obtaining an edge defect detection result. In the process, the edge points are determined with high precision by analyzing the image of the to-be-detected object and scoring the edge points, the corresponding edge point is fitted to obtain the fitted edge matched with the edge of the to-be-detected object, the distance between the candidate edge point and the fitted edge is accurately computed, edge defects are judged, and a detection result is automatically obtained, so that manual intervention is not required and the precision and efficiency of edge defect detection are effectively improved.

Description

technical field [0001] The invention relates to the technical field of image processing, in particular to an edge defect detection method and device. Background technique [0002] Industrial products often contain edges of various shapes, such as edges of circles, rectangles, and combinations of straight lines and arcs. Edge is an important feature of industrial products, which directly affects the quality of industrial products, and edge defect detection has always been a difficult problem for those skilled in the art. [0003] Edge defect detection mainly detects the consistency of the edge of industrial products, that is, detects whether there are defects such as convex marks and dents on the edge of industrial products. Specifically, for example, the edge defect detection of the outer screen of the mobile phone and the silicon chip of the integrated circuit. Edge; if there are defects on the edge of the outer screen of the mobile phone, it will affect the assembly of t...

Claims

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Application Information

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IPC IPC(8): G06T7/00
CPCG06T7/0008G06T2207/30164
Inventor 彭斌姚毅高中伟周钟海
Owner BEIJING LUSTER LIGHTTECH
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