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Method for improving test of SMD quartz crystal resonator by employing network analyzer

A technology of network analyzer and quartz crystal, which is applied in the field of component manufacturing, can solve problems affecting test accuracy and efficiency, reduce test accuracy, and increase the risk of misoperation, and achieve the effects of easy promotion, improved test accuracy, and reduced scrap rate

Active Publication Date: 2016-02-03
LANGFANG CHINA ELECTRONICS PANDA CRYSTAL TECH
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  • Application Information

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Problems solved by technology

Frequent replacement of test slots and calibration will reduce test accuracy, increase the risk of misoperation, and affect test accuracy and efficiency

Method used

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  • Method for improving test of SMD quartz crystal resonator by employing network analyzer
  • Method for improving test of SMD quartz crystal resonator by employing network analyzer
  • Method for improving test of SMD quartz crystal resonator by employing network analyzer

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Embodiment Construction

[0019] A design method for improving the normal temperature characteristics of an SMD quartz crystal resonator using a network analyzer, comprising the steps of:

[0020] 1) By making statistics on the pad size of the resonator base of common models;

[0021] 2) Calculate the contact position parameters that can be applied to the corresponding pad (see Table 1);

[0022] 3) According to the contact position parameters, change the contact design of the test slot from the traditional dot shape to the strip shape (see figure 2 ), thus applicable to all sizes of resonators.

[0023] Such as figure 2 Shown: network analyzer test slot, abandoning the crystal placement slot, redesigning two contact pieces (9), enlarging its area and designing its shape, so that crystal resonators of different types and sizes can be placed directly On the contact sheet (9), the crystal is connected to the test module of the network analyzer through the contact sheet (9), the connecting column (11...

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Abstract

The invention provides a design method for improving the test of the room temperature characteristic of an SMD quartz crystal resonator by employing a network analyzer. The method includes following steps: 1) performing statistics of the dimension of a resonator base pad of the common type; 2) calculating contact position parameters capable of being applied to the corresponding pad; and 3) changing the contact design of a test groove from the conventional point shape to the strip shape according to the contact position parameters, thereby adapting to the resonators of all the dimensions. The method is advantageous in that the method can be applied to the resonators of all the dimensions, high-reliability contact and high-precision test of the room temperature characteristic of the quartz crystal resonators of different specifications and dimensions can be realized, the replacement of the test grooves and calibration are not needed during the tests of the resonators of different specifications, the test precision and the work efficiency are improved, and the promotion value is provided for the improvement of the test efficiency of products of the same kind.

Description

technical field [0001] The invention relates to a design method for improving the normal-temperature characteristics of an SMD quartz crystal resonator tested by using a network analyzer, and belongs to the field of element and device manufacturing. Background technique [0002] At present, the common package sizes of SMD quartz crystal resonators are 7.0*5.0mm, 6.0*3.5mm, 5.0*3.2mm, 4.0*2.5mm, 3.2*2.5. With mobile communications, consumer electronics, car audio and video, and IT information, electronic components including SMD quartz crystal resonators are required to be miniaturized, and smaller packages are gradually appearing, such as 2.5*2.0mm, 2.0 *1.6mm, 1.6*1.2mm. In the production process of SMD quartz crystal resonators, it is necessary to use the network analyzer to test the room temperature characteristics of the resonator many times. As the core connection device between the network analyzer and the SMD quartz crystal resonator, the test socket must also adapt ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 白利才吴敬军卞玉
Owner LANGFANG CHINA ELECTRONICS PANDA CRYSTAL TECH
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