Detection apparatus and automatic exposure method and system for high frequency X-ray radial detection apparatus

Abstract

The invention discloses a detection apparatus and an automatic exposure method and system for a high frequency X-ray radial detection apparatus. The method comprises the following steps of storing exposure curve charts of different metal materials in the detection apparatus, establishing an exposure curve database, receiving the distance parameter of the detection apparatus and a to-be-detected object and the thickness parameter of the to-be-detected object, which are input by a user; retrieving the exposure curve database, output exposure voltage and exposure time according to the distance parameter of the detection apparatus and the to-be-detected object and the thickness parameter of the to-be-detected object, and receiving a user operation command so as to carry out flaw detection exposure on the to-be-detected object by using the output exposure voltage and exposure time. According to the invention, only the thickness of the to-be-detected object is input, then the distance of the detection apparatus and the to-be-detected object can be exposed accurately, the operation and use are simple, the degree of accuracy is high, the parameter set steps of the traditional detection apparatus are simplified, the error and workload of the workers are reduced and the detection work efficiency is improved.

Description

technical field [0001] The invention relates to the field of flaw detectors, in particular to an automatic exposure method and system for a high-frequency X-ray flaw detector and a flaw detector. Background technique [0002] Use X-rays to irradiate the measured object, and place an X-ray photosensitive film on the back of the measured object. If there are defects such as damage, debris, and pores on the surface or inside of the measured object, due to their absorption of X-rays and the main body of the measured object The components are different, so that an image will eventually be formed on the negative film, and the position and size of the defect can be found through the negative film, which is the basic principle of X-ray non-destructive testing. [0003] X-ray non-destructive testing technology has been widely used in industrial and agricultural production fields such as boilers, pressure vessels, bridges, oil pipelines, ships, and food processing due to its strong ...

AI Technical Summary

Problems solved by technology

[0004] However, when performing X-ray flaw detection in the field and in the field, it is necessary to measure the distance F from the X-ray exit window to the object and the thickness D of the object to be measured, and then find the exposure curve according to F and D to determine the KV and exposure time T of the ray machine For these two parameters, the parameter setting is complicated, and it needs someone with certain experience to complete the flaw detection process. It is easy to mischeck and the workload is large, and the flaw detection efficiency is low.

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