Eureka AIR delivers breakthrough ideas for toughest innovation challenges, trusted by R&D personnel around the world.

Shock waveform peak value measurement method based on parameter fitting

A technology of shock waveform and measurement method, which is applied in the field of vibration shock and mechanical engineering, can solve the problems affecting the measurement accuracy, not fully suitable for half-sine and Gaussian shock waveforms, etc., and achieve accurate and objective pulse peak effects

Active Publication Date: 2015-07-22
BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
View PDF3 Cites 9 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The purpose of the present invention is to overcome the defect that the ISO recommended method requires pre-filtering, thereby affecting the measurement accuracy, and the IEC recommended method is not completely suitable for half-sine and Gaussian shape shock waveforms, so as to improve the half-sine shape and Gaussian shape. For the purpose of measuring and calculating the accuracy of the peak value of the shock waveform, a method for measuring the peak value of the shock waveform based on parameter fitting is proposed

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Shock waveform peak value measurement method based on parameter fitting
  • Shock waveform peak value measurement method based on parameter fitting
  • Shock waveform peak value measurement method based on parameter fitting

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0038] The implementation of the method of the present invention will be described in detail below in conjunction with the accompanying drawings.

[0039] A method for measuring the peak value of a shock waveform based on parameter fitting, the specific steps of which include:

[0040] Step 1, such as figure 1 As shown, the shock excitation source is used to generate a waveform, which can approximate a half-sine shock excitation or a Gaussian shock excitation. Use the sensor and supporting waveform data acquisition system for waveform measurement to obtain a complete sampling sequence of equal intervals in the shock measurement waveform.

[0041] Step 2: Use the comparison method to obtain the maximum value of 3.8V and the minimum value of 0.2V of the shock waveform, and intercept the waveform of the approximate half-sine part between the maximum value and the minimum value of the shock waveform for peak calculation. Here, with the peak position as the center, more than 3 in...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a shock waveform peak value measurement method based on parameter fitting, and belongs to the fields of vibration shock and mechanical engineering and the technical field of metrology testing. The method comprises the following specific steps: generating shock excitation by using a shock excitation source, and performing waveform measurement by using a sensor and a matched waveform data acquisition system to obtain a complete shock measurement waveform uniformly-spaced sampling sequence; acquiring the maximum value and the minimum value of a shock waveform by using a comparison method; intercepting an approximate half-sine part waveform close to a peak value between the maximum value and the minimum value from the shock measurement waveform uniformly-spaced sampling sequence for use in peak value calculation; performing a four-parameter fitting process of a shock waveform peak value by using a sine wave fitting method; iteratively calculating a shock measurement waveform peak value by using a fitting sine wave amplitude value and a direct-current component; and giving a fitting residue effective value serving as an assistant criterion for judging the performance of peak value fitting. The shock waveform peak value measurement method has the calculation effects of omission of a peak value filter, higher accuracy and higher resolution.

Description

technical field [0001] The invention belongs to the fields of vibration and shock, mechanical engineering and measurement and testing technology, and relates to a method for measuring the peak value of a shock waveform, in particular to a method for measuring the peak value of a shock wave due to mechanical shock, electrical shock, gas shock, liquid shock, sound shock, light shock, explosion, etc. Peak measurement method for shock waveforms. Background technique [0002] The shock waveform belongs to the pulse wave, and the calculation and determination of the pulse peak value are the basic problems in the pulse measurement. Shock measurement is in many cases related to safety and damage performance of weaponry etc. For example, when the spacecraft lands and recovers, people will measure the maximum acceleration when it lands, so as to evaluate and determine whether it exceeds the tolerance limit of the human body and equipment, and then take protective technical measures; ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): H03K5/1532
Inventor 梁志国李新良朱振宇
Owner BEIJING CHANGCHENG INST OF METROLOGY & MEASUREMENT AVIATION IND CORP OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com