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Ka frequency band base plate integrated magnetic coupling near field probe

A magnetic coupling and substrate technology, which is applied in the field of Ka-band substrate integrated magnetic coupling near-field probes, can solve the problems of large volume of waveguide probes, and achieve the effects of stable measurement data, strong adaptability, and simple operation

Inactive Publication Date: 2015-06-03
LEIHUA ELECTRONICS TECH RES INST AVIATION IND OF CHINA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Waveguide probes are bulky and not suitable for millimeter wave circuit testing

Method used

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  • Ka frequency band base plate integrated magnetic coupling near field probe
  • Ka frequency band base plate integrated magnetic coupling near field probe
  • Ka frequency band base plate integrated magnetic coupling near field probe

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[0025] The first circuit substrate and the second circuit substrate are made of Rogers5880 plate, thickness 0.508mm, stripline length 6mm, width 0.8mm, coplanar waveguide length 5.8mm, width 1mm, transition section length 1.2mm, width 0.25mm, metallized coupling The diameter of the through hole is 0.3mm, the distance from the edge of the metallized coupling through hole to the coupling surface is 0.3mm, the width of the vertical section of the T-shaped terminal is 0.25mm, the length is 0.2mm, the length of the horizontal section is 0.7mm, and the width is 0.3mm. It is 0.15mm. Connectors use 2.92mm series connectors.

[0026] The coupled signal can be obtained by placing the probe above the microstrip line under test. In the range of 20 to 30 GHz, the coupling amount is between -17 and -15 dB.

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Abstract

The invention relates to the technical field of field distribution detection, on-line debugging and fault diagnosis of a Ka frequency band circuit, in particular to a magnetic coupling near field probe. A Ka frequency band base plate integrated magnetic coupling near field probe comprises a first circuit base plate, a second circuit base plate, a first metal structure element, a second metal structure element and a connector. The probe has the advantages that the magnetic coupling probe based on double-layer metal medium base plates is adopted, a PCB (printed circuit board) process is adopted for being matched with simple machining process manufacturing, the manufacturing is simple, the cost is low, the size is small, and the transmission performance is good. The probe does not need plastic sleeve protection, the direct handheld operation can be realized, a special test frame is not needed, and the short circuit danger is avoided. The probe is suitable for being used for Ka frequency band circuit magnetic field measurement, the demand on the space is small, the adaptability is high, and the data measurement is more stable.

Description

technical field [0001] The invention relates to the technical field of field distribution detection, online debugging and fault diagnosis of Ka frequency band circuits, in particular to a magnetic coupling near-field probe. Background technique [0002] In the field of circuit design, near-field probes are often used for EMC testing and diagnosis of circuits, reducing interference and spurs caused by EMC / EMI problems, and judging the working status of circuits. Generally, magnetic probes are used in the frequency band of 1-6GHz, electrical coupling probes based on coaxial cables can be used in the frequency band of 1-20GHz, and Ka-band probes usually use waveguide probes. [0003] The working frequency of EMC magnetic probes and electric probes is low, and the protective plastic sleeve will cause loss. Waveguide probes are bulky and not suitable for millimeter wave circuit testing. Contents of the invention [0004] The technical problem to be solved in the present inven...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R1/067
Inventor 赵晖王小军聂翀
Owner LEIHUA ELECTRONICS TECH RES INST AVIATION IND OF CHINA
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