Dark field illumination method based on total internal reflection

Abstract

The invention discloses a dark field illumination method based on total internal reflection. The dark field illumination method can be applied to optical microscopic imaging studies on micro / nano-particles, biological samples and the like. Dark field illumination on the sample is achieved on the basis of total internal reflection of illuminating light; scattered light or fluorescent light of the sample is utilized as a signal for optical imaging and detection, thus observation and measurement on micro / nano-scale samples are achieved; and the dark field illumination method has good applicability and compatibility on existing imaging devices such as microscopes. The illuminating light is subjected to total internal reflection for once or a plurality of times in a total internal reflection prism or a sample pool by the total internal reflection to form total internal reflection dark field illumination; and the dark field illumination method can be applied to the fields of studies on nano materials, biological cells, interaction between light and materials, and the like.

Description

technical field [0001] The present invention relates to an illumination method for microscopic imaging, in particular to a dark-field illumination method, in particular to the observation of micro-nano particles and biological samples in the sample pool by using the total internal reflection prism and the total internal reflection of the sample pool and research, and can be widely and flexibly applied to existing microscopes or self-built imaging systems. Background technique [0002] Imaging technology is based on the traditional optical imaging microscope combined with new laser technology to develop into a widely used fluorescence microscope. At the same time, with the development of biomolecular science and nanomaterial science, the research object is progressing from the micrometer scale to the nanometer scale. The technical means of higher resolution and signal-to-noise ratio have become the goal of imaging science. Recently, nano-materials with special properties suc...

AI Technical Summary

Problems solved by technology

However, the sample thickness and imaging range are still very limited.

[0006] The purpose of the present invention is to overcome the deficiencies of the existing dark field and total internal reflection evanescent field illumination technology in terms of sample thickness and imaging range, etc., and provide a low-cost, easy-to-implement imaging using the scattering characteristics of the interaction between illumination light and samples A novel dark-field illumination method

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