Millimeter wave free oscillation source automatic test system and method

Abstract

The invention provides a millimeter wave free oscillation source automatic test system and method. The system at least comprises a millimeter wave free oscillation source to be tested, a direct current voltage source connected with the millimeter wave free oscillation source to be tested, a directional coupler with an input port connected onto the millimeter wave free oscillation source to be measured, an attenuator connected onto a coupling output port of the directional coupler, a mixer connected with the attenuator, a frequency analyzer connected onto the mixer, a power sensor connected onto a direct through output port of the directional coupler and a power meter connected onto the power sensor. Synchronous test of multiple performance parameters of the millimeter wave free oscillation source can be achieved through single connection, test data can be stored synchronously to facilitate follow-up processing, and automatic test of output frequency, output power and direct current power consumption of the millimeter wave free oscillation source in full band can be achieved.

Description

technical field [0001] The invention relates to the technical field of millimeter wave testing, in particular to an automatic testing system and testing method for a millimeter wave free oscillation source. Background technique [0002] Millimeter waves have good atmospheric penetration characteristics and rich spectrum resources, and have great significance and application prospects in the fields of communication, guidance, radar, and clinical medicine. The millimeter-wave free-oscillating source is the core of the millimeter-wave communication system, and its output frequency, phase noise, linearity and tuning characteristics are related to the performance of the entire communication system. [0003] At present, there is a lack of domestic millimeter-wave automatic test methods: on the one hand, the cost of millimeter-wave test equipment is high, and some millimeter-wave frequency bands lack ready-made test and measurement instruments; Multiple connection step-by-step tes...

AI Technical Summary

Problems solved by technology

[0003] At present, there is a lack of domestic millimeter-wave automatic test methods: on the one hand, the cost of millimeter-wave test equipment is high, and some millimeter-wave frequency bands lack ready-made test and measurement instruments; Multiple connection step-by-step tests are all operated through the operation panel buttons and manual data recording is required. The test is very cumbersome and the accuracy is not high, and the subsequent data processing is also very troublesome.

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