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Rapid three-dimensional measurement system and method for correcting nonlinear distortion through lookup tables

A three-dimensional measurement and look-up table technology, applied in measurement devices, optical devices, instruments, etc., can solve problems such as camera overflow and underflow, projector nonlinear distortion, etc.

Active Publication Date: 2014-04-16
成都天拓众成科技有限公司
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Problems solved by technology

[0008] The purpose of the present invention is to overcome the above-mentioned deficiencies in the prior art, and provide a fast three-dimensional measurement system and method that uses a lookup table to correct nonlinear distortion. The lookup table obtained by pre-calibration not only solves the problem of projector nonlinear distortion, but also Also overcomes camera overflow and underflow issues

Method used

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  • Rapid three-dimensional measurement system and method for correcting nonlinear distortion through lookup tables
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  • Rapid three-dimensional measurement system and method for correcting nonlinear distortion through lookup tables

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Embodiment 1

[0075] as attached figure 1 , attached figure 2 , attached image 3 As shown, the present embodiment uses a look-up table to correct a fast three-dimensional measurement system for nonlinear distortion, including a projector, a camera, a computer, and a target for three-dimensional calibration. The target is placed in the light that the camera can capture and the projector emits. The range that can also be covered, the computer performs signal transmission with the projector and the camera respectively, and also includes a trigger circuit for controlling the synchronous opening of the camera and the projector, the synchronous trigger circuit adopts an NPN triode amplifier circuit, and the VGA pin of the computer The control output terminal is respectively connected with the base of the projector and the triode amplifier circuit, and the collector of the triode amplifier circuit is connected with the camera. In order to ensure that the camera and the projector are in a synch...

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Abstract

The invention relates to the technical fields of digital images and three-dimensional data processing, particularly to a rapid three-dimensional measurement system and method for correcting nonlinear distortion through lookup tables. The method comprises establishing the three-dimensional measurement system; calibrating the three-dimensional measurement system; establishing lookup tables about grey level nonlinear distortion correction; generating structured light scanning images containing fundamental frequency and high frequency and pre-correcting the generated structured light scanning images through the lookup tables to obtain images for three-dimensional measurement; scanning an object to be measured and capturing image data containing object information synchronously; calculating the obtained scanning image data to generate three-dimensional point cloud coordinates for display. By establishing the lookup tables about the grey level nonlinear distortion correction through pre-calibration and performing grey level correction on the generated structured light scanning image data through the lookup tables, the rapid three-dimensional measurement system and method for correcting nonlinear distortion through the lookup tables can effectively overcome the influence of nonlinearity, namely, Gamma of a projector and meanwhile solve the problem of overflow and underflow of pixel value, which occurs during the measurement process.

Description

technical field [0001] The invention relates to the technical field of digital image and three-dimensional data processing, in particular to a fast three-dimensional measurement system and method for correcting nonlinear distortion by using a lookup table. Background technique [0002] Optical 3D measurement is divided into passive 3D measurement and active 3D measurement. Passive 3D measurement technology does not require structured light illumination, directly obtains 2D images from one or more camera systems, and extracts 3D information based on parallax and other information. The key to passive measurement is to use correlation algorithms to find corresponding points from different images. Although this method has a simple hardware structure, it is only suitable for occasions where the details of the measured object are not high, and it is rarely used in the field of industrial measurement. Active three-dimensional measurement technology uses different projection device...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/25
Inventor 刘凯王帅军胡子阳
Owner 成都天拓众成科技有限公司
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