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Method of accurately measuring any deformation map

A map and measurement technology, which is applied in the field of accurate measurement of arbitrary deformable electronic maps, and can solve the problems of lack of measurement function and affecting the use of accurate measurement.

Inactive Publication Date: 2014-02-12
SHANGHAI MAPPING INST
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  • Abstract
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  • Claims
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AI Technical Summary

Problems solved by technology

[0002] At present, in the field of map measurement on mobile terminals such as mobile phones and tablet computers, the precise measurement function of the map is realized by using the electronic map and the electronic map with the geographic reference system (geographical coordinates). Irregular maps of the geographic reference system, such as arbitrarily deformed maps or hand-drawn maps that lose the geographic reference system, do not have accurate measurement functions in the prior art, which affects people’s accuracy of arbitrarily deformed maps or hand-drawn maps that lose the reference system use of measurement

Method used

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  • Method of accurately measuring any deformation map
  • Method of accurately measuring any deformation map
  • Method of accurately measuring any deformation map

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Experimental program
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Embodiment

[0061] Such as figure 1 As shown, in the deformation of the mobile terminal figure 1 set one on and the variant ground figure 1 Index grids (grids) 2 deformed together; as in figure 2 As shown, the actual distance corresponding to the index grid 2 is 200m*200m (that is, the distance of each grid 21 is 200m), and all the M grid nodes 22 in the index grid 2 are the feature points Pi(i =1, 2, 3...M-1 or M, M is a positive integer), after establishing the pixel coordinates, obtain the pixel information data Pi (px i ,py i ) and the latitude and longitude data Qi (x i ,y i ).

[0062] Such as image 3 As shown, the pixel information data Pi(px i ,py i ) and corresponding point Qi longitude and latitude data Qi (x i ,y i ) associated with the input feature point database (i=1, 2, 3... M-1 or M, M is a positive integer).

[0063] Such as Figure 4 As shown, the traversal search is performed. Since the grid distribution in this embodiment is uniform, it is only necessary...

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Abstract

The invention relates to a method of accurately measuring, in particular to a method of accurately measuring a map. The method of accurately measuring the map comprises the following steps of establishing a fitting relationship through utilizing pixel information data of characteristic points and pixel information data of measuring points, measuring geographical coordinate information data of measuring points according to the fitting relationship and the geographical coordinate information data of the characteristic points, measuring the length of line segments or the area of a polygon which is formed by a plurality of calculating points, and drawing on the map so as to precisely measure any deformation map losing a geographical reference system or a hand-painted map.

Description

technical field [0001] The invention relates to a method for precise measurement, in particular to a method for precise measurement and calculation of an arbitrarily deformed electronic map. Background technique [0002] At present, in the field of map measurement on mobile terminals such as mobile phones and tablet computers, the precise measurement function of the map is realized by using the electronic map and the electronic map with the geographic reference system (geographical coordinates). Irregular maps of the geographic reference system, such as arbitrarily deformed maps or hand-drawn maps that lose the geographic reference system, do not have accurate measurement functions in the prior art, which affects people’s accuracy of arbitrarily deformed maps or hand-drawn maps that lose the reference system The use of calculations. [0003] Electronic map measurement: a method to measure and calculate relevant elements on an electronic map to obtain their quantitative char...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 刘美兰吴珏吕艳红姚银银陆爱军毛智俊
Owner SHANGHAI MAPPING INST
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