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Product accelerated degradation test scheme design method based on engineering experience

An accelerated degradation test and scheme design technology, applied in calculation, special data processing applications, instruments, etc., can solve the problems of high manufacturing cost and small total sample size

Inactive Publication Date: 2013-09-04
BEIHANG UNIV
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  • Abstract
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  • Application Information

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Problems solved by technology

The production and manufacturing costs of such products are relatively high, which determines that the total sample size that can be invested in the accelerated change test is usually small
However, its own life level is relatively high, and the design life is as long as several years. How to evaluate its life index with high precision based on the test data of a small number of samples in a short test time, on the one hand, puts forward the information utilization rate of the evaluation method. On the other hand, it also poses a huge challenge to the experimental design

Method used

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  • Product accelerated degradation test scheme design method based on engineering experience
  • Product accelerated degradation test scheme design method based on engineering experience
  • Product accelerated degradation test scheme design method based on engineering experience

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Embodiment Construction

[0082] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments.

[0083] The following examples are as follows figure 1 The flow shown is implemented, and this embodiment selects a certain accelerometer scale factor as an implementation example of the method. The scale factor is one of the key performance parameters of the accelerometer, and its long life is an important performance index of the high-precision accelerometer, and the life index is generally expressed in terms of life. This method provides an effective way for the design optimization of the acceleration change test of a certain accelerometer scale factor.

[0084] A kind of design method of product accelerated degradation test scheme based on engineering experience of the present invention, taking a certain accelerometer scale factor as an example, its specific implementation steps are as follows, as figure 2 Shown:

[0085] The basic assu...

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Abstract

A product accelerated degradation test scheme design method based on engineering experience includes the following steps that constraint conditions of conducting test design are determined, wherein the constraint conditions comprise test time, test sample sizes and test expenses, and the test expenses have a whole restraining relationship with the test time, the test sample sizes and test frequency; prior information of an accelerated degradation test is determined, wherein the prior information is obtained according to the engineering experience, design criteria and similar product information and through finite element analysis and product diagnostic test analysis; a design scope of corresponding test design elements is given according to engineering principles and corresponding calculation empirical formulas, wherein the design scope comprises test stress level numbers, stress levels, the test sample sizes, the test time and the test period of the test; corresponding test design alternative schemes are constructed on the basis of the calculation results, and the accelerated degradation test scheme is determined according to the engineering experience and an implement difficulty level.

Description

technical field [0001] The invention proposes a product accelerated degradation test scheme design method based on engineering experience, which belongs to the reliability technical field of accelerated test design. Background technique [0002] With the development of modern science and technology, the improvement of industrial level, and the continuous development of reliability technology, more and more products have the characteristics of high reliability and long life. The manufacturing costs of such products are relatively high, which determines that the total sample size that can be invested in accelerated change tests is usually small. However, its own life level is relatively high, and the design life is as long as several years. How to evaluate its life index with high precision based on the test data of a small number of samples in a short test time, on the one hand, puts forward the information utilization rate of the evaluation method. On the other hand, it als...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 许丹张辉睿陈云霞林逢春康锐
Owner BEIHANG UNIV
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