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High-precision micro resistor measurement method based on double-current voltage ratio method and measurement system for realizing method

A voltage ratio and measurement method technology, applied in the direction of measuring electrical variables, measuring devices, measuring resistance/reactance/impedance, etc., can solve problems such as the impact of measurement accuracy, achieve improved anti-interference ability, strong anti-interference ability, and high measurement accuracy Effect

Inactive Publication Date: 2013-08-07
HARBIN UNIV OF SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The purpose of the present invention is to solve the problem of power supply accuracy and the influence of DC interference superimposed on the measured micro-voltage signal on the measurement accuracy in the existing micro-resistance measurement technology. The present invention proposes a dual-current-voltage ratio method. Micro-resistance high-precision measurement method and measurement system for realizing the method

Method used

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  • High-precision micro resistor measurement method based on double-current voltage ratio method and measurement system for realizing method
  • High-precision micro resistor measurement method based on double-current voltage ratio method and measurement system for realizing method
  • High-precision micro resistor measurement method based on double-current voltage ratio method and measurement system for realizing method

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specific Embodiment approach 1

[0037] Specific Embodiment 1: A high-precision measurement method for micro-resistors based on the dual current-voltage ratio method described in this embodiment, the specific process is as follows, first, the measured resistance 1, the fixed-value resistance 2 and the adjustable current-limiting resistance 3 Connected in series to the power output side of the controllable DC power supply to form a series closed loop, the output voltage of the controllable DC power supply is E, and the resistance value of the measured resistance 1 is R X , the resistance value of fixed value resistor 2 is R 0 , the resistance of the adjustable current limiting resistor 3 is R 1 , using the four-wire resistance measurement method to measure and obtain the measured voltage U at both ends of the fixed value resistor 2 1 , the measured voltage U across the measured resistance 1 2 and the current I of the series closed loop, the resistance value R of the measured resistance 1 is calculated X , ...

specific Embodiment approach 2

[0040] Specific implementation mode two: see figure 1 This embodiment is described. The difference between this embodiment and the high-precision measurement method for micro-resistance based on the dual current-voltage ratio method described in the first embodiment is that the resistance value of the measured resistor 1 is obtained through the calculation, and the specific The process is, according to the formula Calculate and obtain the resistance value R of the measured resistance 1 X .

[0041] said formula R 0 is based on the formula I = E R 1 + R 0 + R x = U 1 R 0 = U 2 ...

specific Embodiment approach 3

[0042] Specific implementation mode three: see figure 2 Describe this embodiment. The difference between this embodiment and the high-precision measurement method for micro-resistors based on the dual-current-voltage ratio method described in the first embodiment is that the resistance value of the measured resistor 1 is eliminated by the dual-current method. R X The DC interference voltage on the above, the resistance value R of the measured resistance 1 after the interference is eliminated X , the specific process is as follows:

[0043] Set the output voltage of the controllable DC power supply as E 1 and E 2 , and E 1 greater than E 2 ,

[0044] When the output voltage of the controllable DC power supply is E 1 , the current corresponding to the series closed loop is I 1 , measure the voltage across the fixed value resistor 2 to obtain the measured voltage U 11 , measure the voltage across the measured resistance 1 to obtain the measured voltage U 21 ,

[0045]...

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Abstract

The invention discloses a high-precision micro resistor measurement method based on a double-current voltage ratio method and a measurement system for realizing the method, relates to a high-precision measurement method and system for a resistor and particularly relates to a method and a system for detecting a micro resistor. The invention aims at solving the problem of the influence of power supply precision and direct current interference overlapped on a measured micro-voltage signal on the measurement precision in the traditional micro resistor measurement technology. The measurement system comprises a measured resistor, a standard resistor, an adjustable current-limiting resistor, a controllable power supply, a filter amplifier, an A / D (Analogue / Digital) converter, a singlechip microcomputer system, a display and an operation keyboard. Firstly, the influence of the power supply on the measurement precision is eliminated by adopting a voltage ratio method; and secondly, the direct-current interference voltage of a resistance value of the measured resistor is eliminated by a double-current eliminating method. The measurement method and the measurement system disclosed by the invention are applied to the technical field of micro resistor measurement.

Description

technical field [0001] The invention relates to a high-precision measurement method and system for resistance, in particular to a detection method and system for tiny resistance. Background technique [0002] In the field of electrical engineering, the problem of micro-resistance measurement is often encountered, such as the measurement of the resistivity of conductor materials, the measurement of DC resistance per unit length of conductors, etc. Since these microresistances are often in the order of tens of μΩ to tens of mΩ, it is difficult to measure them. At present, the micro-resistance measuring instruments provided on the market are generally DC double-arm bridges and digital micro-ohmmeters. The DC double-arm bridge needs to be balanced and adjusted, and the degree of measurement automation is low and easily affected by changes in adjustable components and human factors; digital micro-ohmmeters generally use constant current source and high-precision digital voltage ...

Claims

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Application Information

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IPC IPC(8): G01R27/08
Inventor 聂洪岩王永红魏新劳陈庆国池明赫王新宇
Owner HARBIN UNIV OF SCI & TECH
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