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Waveform data processing method for digital three-dimensional oscilloscope

A technology of waveform data and processing method, applied in the field of digital three-dimensional oscilloscope, which can solve the problems of easy loss of abnormal signal information, influence of parameter measurement accuracy, not centralized trend, etc.

Inactive Publication Date: 2013-03-27
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

Therefore, based on the histogram of a single waveform, it is easy to lose the information of abnormal signals, which will affect the accuracy of parameter measurement
In addition, the mean value is easily affected by the maximum and minimum values, and is not the best statistic of the central tendency. Although the mode has the most frequent occurrence frequency, it cannot reflect the distribution of the central tendency of the data.

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  • Waveform data processing method for digital three-dimensional oscilloscope
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  • Waveform data processing method for digital three-dimensional oscilloscope

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Embodiment Construction

[0031] Specific embodiments of the present invention will be described below in conjunction with the accompanying drawings, so that those skilled in the art can better understand the present invention. It should be noted that in the following description, when detailed descriptions of known functions and designs may dilute the main content of the present invention, these descriptions will be omitted here.

[0032] The waveform data processing method of digital three-dimensional oscilloscope of the present invention comprises the following steps:

[0033] Step 1: The vertical resolution of the signal collected by the ADC is dbit, the number of sampling points collected at one time is k, and each sampling point has m=2 d amplitude sample value s 0 ,s 1 ,...,s m-1 ,s m-i = 2 d-i, 1≤i≤m, the sampling points of N waveforms are mapped to the three-dimensional waveform database, as the object of waveform data processing, the three-dimensional waveform database can be regarded as...

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Abstract

The invention discloses a waveform data processing method for a digital three-dimensional oscilloscope. Multiple-amplitude waveform data acquired in a primary refresh cycle are mapped into a three-dimensional data base, contents of the three-dimensional data base serve as data processing objects to be subjected to statistical histogram analysis, and a K mean value clustering algorithm is adopted to divide a histogram into a high portion and a low portion, namely Hupper and Hlower. High state level and lower state level of a pulse parameter, namely a top end value vtop and a bottom end value vbase are estimated according to the Hupper and the Hlower. Other waveform parameters, such as amplitude, lifting-descending time and cycle can be calculated according to the top end value vtop and the bottom end value vbase. By adopting the waveform data processing method, the influence of an abnormal value and an accidental signal on the waveform parameter measurement can be avoided, and the accuracy of amplitude types of parameter measurement results can be effectively improved under the high-noise condition.

Description

technical field [0001] The invention belongs to the technical field of digital three-dimensional oscilloscopes, and more specifically relates to a waveform data processing method of a digital three-dimensional oscilloscope. Background technique [0002] With the rapid growth of the bandwidth and non-stationary characteristics of electronic signals, higher requirements are put forward for the test accuracy and speed of time-domain test instruments. In order to meet the test requirements of such signals, digital oscilloscopes need to have high real-time sampling rate, high waveform capture rate and high-precision parameter measurement functions to ensure reliable signal acquisition, capture and measurement. The measurement function of waveform parameters is one of the essential functions of modern oscilloscopes. The accuracy and reliability of its measurement are not only related to the real-time sampling rate, storage depth and noise level of the system, but also related to t...

Claims

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Application Information

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IPC IPC(8): G01R13/02
Inventor 叶芃张沁川潘卉青黄武煌杜兴批
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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