Waveform data processing method for digital three-dimensional oscilloscope
A technology of waveform data and processing method, applied in the field of digital three-dimensional oscilloscope, which can solve the problems of easy loss of abnormal signal information, influence of parameter measurement accuracy, not centralized trend, etc.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0031] Specific embodiments of the present invention will be described below in conjunction with the accompanying drawings, so that those skilled in the art can better understand the present invention. It should be noted that in the following description, when detailed descriptions of known functions and designs may dilute the main content of the present invention, these descriptions will be omitted here.
[0032] The waveform data processing method of digital three-dimensional oscilloscope of the present invention comprises the following steps:
[0033] Step 1: The vertical resolution of the signal collected by the ADC is dbit, the number of sampling points collected at one time is k, and each sampling point has m=2 d amplitude sample value s 0 ,s 1 ,...,s m-1 ,s m-i = 2 d-i, 1≤i≤m, the sampling points of N waveforms are mapped to the three-dimensional waveform database, as the object of waveform data processing, the three-dimensional waveform database can be regarded as...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com