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Test data generating method and device

A technology of test data and data generation unit, applied in the field of testing, can solve the problems of scattered data, difficult to meet the needs of targeted testing, lack of focus, etc., to achieve the effect of ensuring comprehensiveness

Active Publication Date: 2013-03-13
CHINA TELECOM CLOUD TECH CO LTD
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  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In the actual test application process, the inventor found that the above-mentioned test data generation method has at least the following problems: First, the correlation between data is difficult to maintain. If the data tables are associated, the test data generated by the random method may not be available; secondly, only correct data can be generated, and wrong data cannot be generated. In the actual test process, for the fault handling of the test program The test of wrong data is often more important than the test of correct data; finally, although the test data generated by the random method has relatively comprehensive coverage, the disadvantage is that there is no focus, and the generated data is too scattered, which is difficult to meet the specific requirements. strong testing requirements

Method used

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  • Test data generating method and device

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Embodiment Construction

[0053] First, a method for generating test data provided by an embodiment of the present invention is described, and the method may include the following steps:

[0054] Obtain preset test data definition information and determine the fields to be included in the test data to be generated;

[0055] Further, according to the association definition information in the test data definition information, determine the association field that needs to be generated; wherein the association field is: a data field that has an association relationship with external data;

[0056] Read the external data, and generate the associated field data value of the test data according to the content of the external data;

[0057] Use random method to generate non-associated field data values ​​of test data.

[0058]The technical scheme of the present invention divides the data fields that need to be generated into two types: associated fields and non-associated fields. For associated fields, the da...

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PUM

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Abstract

The invention discloses a test data generating method and a test data generating device. The test data generating method comprises the following steps that the preset test data definition information is obtained, and fields contained in test data to be generated are determined; further, relevant fields to be generated are determined according to the relevant definition information in the definition information of the test data, wherein the relevant fields are data fields with the relevant relationship with external data; the external data is read, and the relevant field data value of the test data is generated according to the content of the external data; and the nonrelevant field data value of the test data is generated by a random method. When the technical scheme disclosed by the invention is applied, the data fields relevant to the external data can be fully considered in the data generating process, so the relevant relationship among data is ensured, and the test requirement of a complicated system is met.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a method and device for generating test data. Background technique [0002] Software testing is an important part of the software life cycle, ensuring the correctness and integrity of computer software. With the development of software testing technology, automated testing technology has been used more and more widely, which mainly includes automatic generation of test data, automatic execution and verification of test cases, automatic deployment of test environment, etc. [0003] In the process of software testing, the preparation of test data is an important link. Quickly and comprehensively preparing test data can not only greatly improve the test efficiency and shorten the test cycle, but also avoid the omission of test cases and increase the coverage of the test. At present, a commonly used test data preparation method is the random test data generation method. The main ide...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 崔萌江峰谢朝阳
Owner CHINA TELECOM CLOUD TECH CO LTD
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