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A mass analysis method and mass spectrometer based on special relativity

A technology of mass analysis and relativity, applied in the field of mass analysis methods and mass spectrometers based on special relativity, can solve the problems that mass analysis technology does not appear, and achieve the effect of obvious advantages, accurate mass and high resolution

Inactive Publication Date: 2014-10-29
FUDAN UNIV
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Problems solved by technology

[0004] The existing mass spectrometry techniques are all based on the theory of electromagnetism and mechanics, but mass analysis techniques based on the theory of relativity have not yet appeared.

Method used

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  • A mass analysis method and mass spectrometer based on special relativity
  • A mass analysis method and mass spectrometer based on special relativity

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Embodiment Construction

[0039] figure 2 As a kind of mass spectrometer based on the special theory of relativity, the ion beam 22 generated by the ion source 21 is introduced into the ion source area 23 of the ion mass detector, and a pulse high voltage is applied between the ion accelerating electrodes 27 and 28 at this time HV 1 32. The ions are pushed out of the ion source area 23 and enter the accelerator area 24. At this time, a pulse high voltage HV is added on the ion accelerating electrodes 28 and 29. 2 33. The ions are pushed out of the accelerator area 24 and enter the accelerator area 25. At this time, a pulse high voltage HV is added on the ion accelerating electrodes 29 and 30. 3 34. The ions are pushed out of the accelerator area 25 and enter the accelerator area 26. At this time, a pulse high voltage HV is added on the ion accelerating electrodes 30 and 31. 435 , the ions are pushed out of the accelerator area 26 , cross the electrode 31 , enter the field-free flight area 36 for ...

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Abstract

The invention belongs to the technical field of quality analysis and particularly discloses a quality analysis method based on the restricted theory of relativity and a mass spectroscope. The method comprises the following steps of: introducing irons of an object to be measured into an iron source area; accelerating the irons to 3*105m / s or more by using an accelerating electric field; introducing the irons into a field-free flying area to freely fly; introducing the irons into an iron detector; and determining the static mass of the irons according to the flying time of the irons in the field-free flying area. The mass spectroscope based on the method comprises the iron source area, the accelerating electric field, a field-free drift tube and the iron detector, wherein the accelerating electric field consists of three or more pulsed high voltages; and the pulsed high voltages are provided by corresponding electrodes. Data measured by the method and the mass spectroscope is the real mass-to-charge ratio of the irons, so the mass is accurate and is not required to be corrected; the mass spectroscope is high in sensitivity and resolution; the quality detection up limit is only limited by the detector; and the mass spectroscope is high in analysis speed, does not require scanning and can realize full-spectrum analysis within tens of seconds.

Description

technical field [0001] The invention belongs to the technical field of mass analysis, and in particular relates to a mass analysis method and a mass spectrometer based on special relativity. technical background [0002] Mass spectrometry is an analytical method for measuring the charge-to-mass ratio of ions. Its basic principle is to ionize the analyte in the ion source to generate charged ions. The ions generated by the ion source are introduced into the mass analyzer, and then the mass of the ions with different charge-to-mass ratios is determined by using the result of the interaction between the electric field or magnetic field distributed in the mass analyzer and the ions. There are many known mass analyzers for mass spectrometry, such as magnetic analyzers, time-of-flight analyzers, quadrupole mass filters, ion traps, and ion cyclotron resonance analyzers. Compared with other mass analyzers, time-of-flight mass analyzers have the advantages of simple structure, high ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01J49/00H01J49/34
Inventor 何小丹陈琛丁传凡
Owner FUDAN UNIV
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