Spacecraft in-cabin pollution load testing device

Abstract

The invention discloses a spacecraft in-cabin pollution load testing device for a vacuum thermal test. The spacecraft in-cabin pollution load testing device consists of an in-cabin pollution load probe system and a testing system which is electrically communicated with the in-cabin pollution load probe system, wherein the probe system comprises a probe and a driver; the probe comprises a sensing wafer and a reference wafer which are fixedly arranged on a flange; a temperature sensor for measuring the two wafers are also arranged on the flange; a circuit structure is arranged in the driver; and the temperature sensor and an output driving circuit in the driver are respectively and electrically communicated with the testing system so as to transmit temperature and frequency data to the testing system. According to the spacecraft in-cabin pollution load testing device for the vacuum thermal test, which is disclosed by the invention, measurement range of 1*10-5g / cm2 of a pollution load is realized, the adaptive temperature of the probe reaches 60 DEG C, and the requirement for monitoring the pollution load of the vacuum thermal test of a spacecraft is met.

Description

technical field [0001] The invention belongs to the field of vacuum heat test of spacecraft, in particular to a device for testing the amount of pollution in a spacecraft cabin of a vacuum heat test. Background technique [0002] The monitoring of the amount of pollution in the spacecraft cabin is one of the key foundations for spacecraft pollution protection. The pollutants in the cabin will deposit or accumulate near the surface of key components of the spacecraft, causing discharge, adhesion, short circuit, and open circuit of key components, which will lead to performance degradation and failure of key components. [0003] The environment inside the spacecraft cabin is very different from the environment outside the cabin. The environment inside the spacecraft cabin is characterized by high temperature and large amount of pollution. After testing and analysis, the temperature inside the cabin can reach 60°C, and the amount of pollution deposited exceeds 10 -5 g / cm 2 Th...

AI Technical Summary

Problems solved by technology

[0008] The object of the present invention is to provide a kind of measuring device for the amount of pollution in the spacecraft cabin for the vacuum heat test, which solves the problems that the existing pollution amount test system cannot withstand high temperature and the pollution amount range is small, so as to provide a new method for the spacecraft vacuum heat test. Provided technical support

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