Method for detecting atypical electronic components

Abstract

The invention relates to a method for detecting atypical electronic components for the quality control of n electronic components at the end of the manufacturing process, said components being subjected to a number p of unit tests providing digital data, said set of n components including electronic components having a response to each of the p unit tests that lies within predetermined limits particular to each of the p tests, wherein the method comprises using the multi-dimensional information of the p dimension responses of said n electronic components. The method uses a generalised principal component analysis for detecting atypical parts in the semiconductor field, or in the fields including modules assembled using electronic components (e.g. an ABS module, a smart card, etc.). The aim of the method is to get close to "zero defect", wherein no part is detected to be substandard by the client.

Description

technical field [0001] The invention relates to the field of quality control of components, especially electronic devices. Background technique [0002] The semiconductor industry produces integrated circuits, so-called electronic devices, which are fabricated on groups of silicon wafers, each wafer comprising hundreds of devices. [0003] In order to guarantee the functionality of these electronic devices, a first set of tests called needle-tip (or probe) tests are performed on the individual devices, which still form part of the wafer. [0004] The various tests, each consisting of electronic measurements, are combined with specification constraints determined especially for the target customers of these electronic components. [0005] If the electronic device's response to at least one test does not meet the specifications for that test in the first set of tests (probes), the electronic device is considered defective and is discarded when it is separated from the wafer. ...

AI Technical Summary

Problems solved by technology

[0015] This shortcoming hinders: partly because it forces the manufacturer to resend the customer a new batch of replacement parts, thereby reducing the perceived quality level of the customer; Critical components in the operation of more complex systems, such as motor controllers or ABS braking systems

In this case, the failure of the device may cause a serious accident, and its consequences will far exceed the pure economic value of the device

[0016] The above risks drive manufacturers to choose to discard too many devices, including a large number of good devices, due to the use of univariate methods (PAT, etc.) or bivariate methods (regression, etc.) Manufacturer loses a few percent of yield and still cannot guarantee removal of potentially defective devices

[0017] Therefore, although effective, these methods are not sufficient to achieve zero defects

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