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Displacement measuring device with reference and measuring method

A technology of displacement measurement and self-contained reference, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as complex measurement accuracy, and achieve the effects of high measurement accuracy, accurate and safe measurement, and simple structure

Active Publication Date: 2010-07-28
XI AN JIAOTONG UNIV +1
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  • Abstract
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Problems solved by technology

[0003] The present invention provides a high-precision, real-time measuring device and method

Method used

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  • Displacement measuring device with reference and measuring method
  • Displacement measuring device with reference and measuring method
  • Displacement measuring device with reference and measuring method

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Embodiment Construction

[0022] The structure of the self-reference displacement measuring device of the present invention is as follows: figure 1 As shown: the measurement device includes a light source part and a projection measurement part. The light source part is a wide field of view parallel light source composed of a point light source 1 (LED light can be used) and a compound lens 3. The point light source is placed on a guide rail 2, which can be used front and rear Moving, adjusting the distance from the point light source 1 to the composite lens 3 can adjust the definition of imaging. The projection measurement part is composed of a positioning frame 5, a measured marker 11, a linear array CCD or PSD photoelectric device 7, and a circuit board 6. There are vertical light-through slits 10, 9, and a point light source 1 at the front and rear of the positioning frame 5. , compound lens 3, light-through slit 9, 10, CCD or PSD photoelectric device 7 centers are all in the same horizontal axis, an...

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Abstract

The invention discloses a displacement measuring device with a reference and a measuring method. The device comprises a point light source for setting a measured point, a composite lens, a positioning frame with front and rear light-through seams, and a CCD or PSD photoelectric device. Wide-field parallel light which is generated by the point light source through the composite lens sequentially passes through the front and rear light-through seams. When a measured marker exists in a light path, one part of light can be shielded by the measured marker and a shadow zone is formed on a CCD or PSD target surface; the changing of the position of the center of the shadow zone relatively to the edge of the rear light-through seam of the positioning frame is measured to obtain the changing of the position of a measured object. The method is applicable to deformation measurement for base points of various dams, bridges, high-rise buildings and high slopes. The invention has the advantages of simple structure, high cost performance, non-contact measurement, high measuring precision and real-time monitoring.

Description

technical field [0001] The invention relates to a measuring device and a measuring method, in particular to a measuring device and a real-time measuring method for measuring the relative displacement of two points with its own reference. Background technique [0002] Due to the current domestic devices and methods involved in real-time displacement measurement, the benchmark will change after the equipment is replaced, and the existing measurement methods are somewhat too complicated and the measurement accuracy is not high, so the relative displacement of two points cannot be accurately measured, and the Accurate real-time acquisition cannot be performed. Contents of the invention [0003] The present invention provides a high-precision, real-time measuring device and method. [0004] To achieve the above object, the present invention is achieved by taking the following technical solutions: [0005] A displacement measurement device with its own reference, including a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/02
Inventor 乐开端闫昕陈冲
Owner XI AN JIAOTONG UNIV
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