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Double refraction measuring method, apparatus and program

A measurement method, birefringence technology, applied in the direction of testing optical properties, etc., can solve the problems of high price of photoelastic modulators, photoelastic modulators are easily affected by temperature, etc., and achieve the effect of simple structure

Inactive Publication Date: 2009-08-12
FUJIFILM CORP
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

[0010] However, the birefringence measurement device of Patent Document 2 has problems that the photoelastic modulator used is expensive and the photoelastic modulator is easily affected by temperature.

Method used

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  • Double refraction measuring method, apparatus and program
  • Double refraction measuring method, apparatus and program
  • Double refraction measuring method, apparatus and program

Examples

Experimental program
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Effect test

Embodiment

[0136] In the examples, first, the birefringent phase difference of the BSC compensation element as the measurement object was measured. The BSC compensation element is a phase element whose birefringence phase difference changes continuously corresponding to the feeding amount of the micrometer screw. In the first verification, in order to verify that the birefringent phase difference can be measured with high accuracy in the range of 0° to 360°, the phase difference of the BSC was set to 0. Change within ~360°, the absolute value of the measurement and the repeatability accuracy of 100 measurements were confirmed. The higher the linearity of the measured birefringence phase difference with respect to the feed amount of the microscrew, the higher the measurement accuracy can be judged. In addition, if Figure 7 As shown, 3σ (σ is the standard deviation) is taken as the repeatability. This measurement was carried out under the conditions of a measurement wavelength of 590 n...

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PUM

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Abstract

the invention provides a method, a device and a program for birefringence determination, and uses simple structure to determine birefringence characteristic without high cost. The birefringence determination device comprises a light source, a polarization element, a phase element, a rotation polarization-detecting element, a sensitimeter and a controller. A phase difference film is inserted between the phase element and the rotation polarization-detecting element. The controller associates transmission shaft direction of the polarization-detecting element and the transmission shaft direction by light intensity sensed by the sensitimeter to generated light intensity data. First light intensity data when the transmission shaft direction of the polarization-detecting element is gamma1 and second light intensity data when the transmission shaft direction of the polarization-detecting element is gamma2 are stored in a light intensity data storage component. main shaft direction of the phase difference film is calculated based on the first or the second light intensity data, simultaneously, delay amount of the phase difference film is calculated based on the main shaft direction of the phase difference film, the first light intensity data and the second light intensity data.

Description

technical field [0001] The present invention relates to a birefringence measurement method, device, and program for measuring the birefringence characteristics of optical films such as retardation films used in liquid crystal display devices. Background technique [0002] In recent years, a large number of liquid crystal display devices (hereinafter referred to as "liquid crystal display devices") have been put on the market. A liquid crystal unit encapsulated with liquid crystal material is arranged in the display panel of the liquid crystal display device, a backlight and a polarizing filter are arranged on one side of the liquid crystal unit, and a retardation film and a polarizing filter are arranged on the other side. [0003] Since the liquid crystal element has wavelength dependence, that is, the transmittance changes according to the wavelength of light, when the light passing through the backlight and the polarizing filter is transmitted through the liquid crystal e...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/02
Inventor 重田文吾下田知之池端康介稻村隆宏
Owner FUJIFILM CORP
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