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Testing adopter and testing tool system and detecting method

A technology for testing adapters and systems under test, which is applied in transmission systems, digital transmission systems, electrical components, etc., and can solve problems such as high coupling between test suites and protocol components, inflexible framework models, and difficult maintenance

Inactive Publication Date: 2009-02-04
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] Judging from the test tool system defined in the above TTCN3 standard, it generally has the following disadvantages: the TA layer has no corresponding mechanism for encapsulation and management; the protocol components written by TA have different shapes, are not standardized, and are not universal, so it is difficult to reuse and write Good protocol components; the test logic in the test suite is complicated to write, and the coupling between the test suite and the protocol components is high; such a framework model is inflexible and difficult to maintain, and cannot guarantee the consistency and inheritance of development
In addition, the TA of the prior art test tool system does not support such a distributed test environment

Method used

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  • Testing adopter and testing tool system and detecting method
  • Testing adopter and testing tool system and detecting method
  • Testing adopter and testing tool system and detecting method

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Embodiment Construction

[0114] The core idea of ​​the present invention is: TA, as an independent application program, realizes dynamic connection with TE through network connection to transmit test information, and this structure of separation of TE and TA makes TS support the requirement of distributed test. The internal structure of TA adopts a hierarchical management structure, and the TA framework realizes the management of public functions through a unified interface, such as completing the communication between TA and TE, configuration of the protocol stack, and other common functions such as message monitoring and alarming; the protocol stack Protocol components are managed through a unified interface, and protocol components can be dynamically combined or removed according to different test requirements, which improves the reusability of protocol components, ensures the consistency and inheritability of development, and saves development investment, but also more flexible for the test of SUT ...

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Abstract

The invention discloses test adaptor (TA), test tool system (TS) composed of TA, and test method. Through network connection, TA as independent application program is connected to test executor (TE) dynamically in order to transfer test information. Structure of layered management is adopted in inner structure of TA. Through uniform interface, TA frame realizes management of common functions such as communication between TA and TE, configuration of protocol stack, as well as other common functions including message monitoring, and alarming etc. Through uniform interface, protocol stack manages protocol modules. Based on different test requirement, protocol modules can be combined dynamically so as to raise reuse of protocol modules. The invention ensures consistency and inheritability of development, and saves investment of development.

Description

technical field [0001] The present invention relates to the test technology in the field of electronics or communication, especially a test adapter (TA, Test Adapter), a test tool system (TS, Test System) composed of the TA, and a test method for the TS. Background technique [0002] Before the product leaves the factory or is officially put into operation, it is generally necessary to use testing tools to test and verify the quality of the product. In the prior art, there are many kinds of testing tools and testing standards. The common testing standard is the TTCN3 standard, which defines TS as a hierarchical sub-module system, which includes a test manager (TM, Test Management), Test Executor (TE, Test Executor) and TA, where TA is an adaptation layer connecting TS and the system under test (SUT, System under test), responsible for adapting and transferring interface calls and message interactions between TS and SUT Wait. [0003] In the test tool system defined in the ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H04L12/26H04L29/06
Inventor 于骏
Owner HUAWEI TECH CO LTD
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