Time-of-flight offset correction method, tof device, electronic device and storage medium
A technology of time-of-flight and offset compensation, which is applied in the directions of measuring devices, design optimization/simulation, electromagnetic wave re-radiation, etc. It can solve the problems affecting the accuracy of time-of-flight ranging, sensing optical signal loss counting, and photon counting histogram distortion and other problems, to achieve the effect of improving the low flight time, precise 3D sensing function, and improving the accuracy of distance measurement
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0018] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present application.
[0019] An embodiment of the present application provides a time-of-flight offset correction method for correcting the time-of-flight offset that exists when distance sensing is performed based on the principle of time-correlated single-photon counting, and the correction method includes the steps of: obtaining correlation detection The total number of sensing optical signal transmission times of the frame and the peak count and half-peak widt...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com