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Multi-specification microscope linkage analysis sample table for transmission electron microscope sample

A transmission electron microscope sample and multi-specification technology, applied in the field of electron microscope analysis, can solve problems such as glove box system incompatibility, achieve the effect of reducing the number of direct disassembly and assembly, overcoming complex structure, and good stability

Pending Publication Date: 2021-07-23
SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The present invention aims at the technical defects of the prior art, and provides a multi-specification microscope linkage analysis sample stage for transmission electron microscope samples, so as to solve the technical problem of incompatibility between the conventional loading structure and the glove box system

Method used

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  • Multi-specification microscope linkage analysis sample table for transmission electron microscope sample
  • Multi-specification microscope linkage analysis sample table for transmission electron microscope sample
  • Multi-specification microscope linkage analysis sample table for transmission electron microscope sample

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Embodiment Construction

[0037] Specific embodiments of the present invention will be described in detail below. In order to avoid too many unnecessary details, well-known structures or functions will not be described in detail in the following embodiments. Approximate language used in the following examples is for quantitative representations, indicating that certain variations in quantities are permissible without altering essential function. Unless defined otherwise, technical and scientific terms used in the following examples have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.

[0038] Multi-specification microscope linkage analysis sample stage for transmission electron microscope samples, such as Figure 1-10 As shown, it includes a unit body, an instrument compatible housing, and an assembler 10 .

[0039] The unit body includes a TEM grid fixed core 1, a TEM grid 2, a washer 3, a hollow fixing screw 4, an internally threaded blin...

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Abstract

The invention provides a multi-specification microscope linkage analysis sample table for transmission electron microscope samples. The sample table comprises a unit body, an instrument compatible shell and an assembler. The unit body plays a role in bearing and fixing the TEM grid, the instrument compatible shell has various specifications, the shape of the instrument compatible shell is matched with the used instrument, the unit body can be fixed, then the instrument compatible shell is suitable for different instruments, and combined analysis of various instruments is achieved. Three fixing grooves are formed in the assembler, so that the TEM grid can be directly fixed, and the unit body and the instrument compatible shell can also be fixed. On the basis of the TEM grid, compatibility of different instruments is achieved through the modularized external structure design, and after the TEM grid is installed at a time, only the corresponding instrument compatible shell needs to be replaced, and the sample table can be used among a plurality of instruments in a combined mode. As a universal sample table scheme, the sample table is suitable for the whole process of two-dimensional material transfer preparation, PLM observation, AFM characterization and SEM analysis, the experiment convenience is fully enhanced, and the experiment efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of electron microscope analysis, in particular to a multi-specification microscope linkage analysis sample stage for transmission electron microscope samples. Background technique [0002] For sensitive materials, especially sensitive two-dimensional materials, sample preparation and characterization in an inert gas-protected glove box system requires the cooperation of various equipment. Since each equipment comes from different manufacturers, there are differences in specifications, models and application requirements. Therefore, TEM samples need to switch multiple times on different instrument sample stages from preparation to basic characterization analysis. [0003] TEM grid is small in size and fragile in structure, and the steps of preparing TEM samples in the glove box system are complicated and difficult to operate. The prepared samples are located on the TEM grid. Switching the sample stage / cup fo...

Claims

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Application Information

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IPC IPC(8): G01N23/04G01N23/2251G01N23/2202G01N23/2206G01N21/84
CPCG01N21/84G01N23/04G01N23/2202G01N23/2206G01N23/2251
Inventor 林君浩赵尔鼎
Owner SOUTH UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA
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