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Method and device for measuring single-shot signal-to-noise ratio improvement of plasma mirror based on synchronous chirped probe pulse

A plasma and chirped pulse technology, applied in the field of ultra-short pulse measurement, to achieve the effect of single-time signal-to-noise ratio improvement measurement, adjustable time accuracy, and single-time measurement

Active Publication Date: 2022-08-09
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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Problems solved by technology

[0004] Aiming at the problems of current ultra-short and ultra-intense laser pulse plasma mirror signal-to-noise ratio measurement technology, the present invention provides a plasma mirror single signal-to-noise ratio improvement measurement device based on synchronous chirped probe pulses and

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  • Method and device for measuring single-shot signal-to-noise ratio improvement of plasma mirror based on synchronous chirped probe pulse

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Embodiment Construction

[0030] In order to make the implementation purpose, technical solutions and technical effects of the present invention clearer, the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments. In the description of the present application, it should be understood that the orientation or positional relationship indicated by the terms "front", "rear", "right", "upper", "vertical", etc. is based on the orientation or positional relationship shown in the accompanying drawings , is only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the indicated device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be construed as a limitation on the present application.

[0031] This embodiment provides a single-shot signal-to-noise ratio measurement de...

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Abstract

A measurement method and device based on a plasma mirror based on the synchronous puppet probe pulse, the simultaneous signal -to -noise ratio of the noise ratio, use the synchronous puppet pulse as the probe pulse, and uses its puppet characteristics to use the reflectivity of the plasma body mirrorThe change of changes into the spectral changes of the puppet pulse can be measured by measuring the mirror mirror in a single signal -to -noise ratio of the plasma mirror through the spectral changes of the pulse light source.The present invention is a single measurement. It is simple and convenient to operate. There is no need to sample the main laser. It solves the traditional third -order interoperable measurement method. The delayed scanning method requires multiple measurement problems and the measurement light intensity problem required for non -linear effects.It helps the single signal ratio of plasma body mirrors to increase the measurement, and there is an important application background in the high -power ultra -short pulse system using the plasma body mirror.

Description

technical field [0001] The invention belongs to the field of ultra-short pulse measurement, in particular to a method and a device for measuring a single-shot signal-to-noise ratio improvement of a plasma mirror. Background technique [0002] With the rapid development of femtosecond laser technology and chirped pulse amplification (CPA). The increasingly high focused power density of lasers is driving the development of various scientific researches, including fast ignition of inertial confinement fusion, laser-driven particle acceleration, and diagnosis of high-power-density plasmas. Relatively, higher requirements are placed on the laser contrast. Among them, the plasma mirror is very suitable for the terminal signal-to-noise ratio improvement of high-power ultra-short pulses due to the characteristics of no fear of damage and good signal-to-noise ratio improvement. [0003] For plasma mirrors, the improvement of signal-to-noise ratio is an important indicator to measur...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J11/00
CPCG01J11/00Y02E30/10
Inventor 朱坪张栋俊梁彦易友建谢兴龙朱健强
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
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