Hardware configurable analog signal comprehensive test system

Abstract

The invention discloses a hardware configurable analog signal comprehensive test system, which comprises N function test modules, an interface management module and an upper computer, wherein the interface management module is provided with N universal function interfaces and a standard bus communication interface; the N function test modules are respectively connected with the interface management module through a universal function interface, the interface management module is connected with the upper computer through a standard bus communication interface, and the interface management module is used for transferring control signals and data between the function test modules and the upper computer. Hardware configuration can be realized; therefore, the space occupancy rate of the analogsignal comprehensive test system is greatly reduced, a tester can more conveniently set parameters of each measuring instrument and collect and organize test results, the portability, flexibility andadaptability to a test environment of the test system are greatly improved, and the test efficiency of the test system can be improved at the same time.

Description

technical field [0001] The invention belongs to the technical field of analog signal testing, and more specifically relates to a hardware configurable analog signal comprehensive testing system. Background technique [0002] In recent years, electronic measuring instruments have been widely used in various aspects of social production, aerospace testing, weaponry testing, etc., which have the advantages of fast measurement speed and high precision, not only related to economy and life, but also to engineering, scientific research, production achievements in many fields. At present, the development of electronic measuring instruments is very rapid, especially under the background of the rapid development of network information technology, it is gradually developing in the direction of hardware configurability, multi-function and digitalization. Due to the rapid development of integrated circuits, the volume and power consumption of electronic measuring instruments are gradua...

AI Technical Summary

Problems solved by technology

Although there are many types of traditional test instruments, they are basically composed of main parts such as data acquisition and analysis, human-computer interaction, etc., and have single functions, no scalability, fixed technical indicators, and poor interaction between instruments, resulting in their use efficiency. The efficiency of secondary development and secondary development is low, and the development cost of large and complex test equipment is extremely expensive

In addition, there is no uniform and standardized custom standard for traditional instruments, the single function lacks versatility, and cannot cover a variety of test conditions and environments. In some special environmental conditions, special measurement equipment needs to be developed separately, which has caused a huge waste of resources.

A large-scale test system is a joint test system composed of multiple test instruments. Although it can complete some complex and extreme test tasks, it is not suitable for rapid on-site movement due to the slow speed of data interaction and the lack of portability and flexibility due to its large size. test

With the increasing complexity of electronic measuring instruments and equipment, traditional single-function test equipment has limited test range and serious shortage of test capabilities, which cannot meet the functional requirements of modern multi-task and multi-objective joint testing.

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