Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Centralized memory monitoring method and device

A centralized storage technology, applied in the computer field, can solve the problems of no centralized storage performance monitoring and prediction of centralized storage performance trends, and cannot meet the needs of efficient operation and maintenance

Active Publication Date: 2020-08-21
TRAVELSKY
View PDF10 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] With the development of science and technology, the business volume of centralized storage is increasing, and the storage scale is also increasing. The management of centralized storage has gradually developed from a single unit to multiple units. Management of multiple centralized storage devices provides convenience, but still cannot meet the needs of efficient operation and maintenance
[0003] This puts forward higher requirements for the management and monitoring of centralized storage. For example, the performance of centralized storage is a key factor affecting whether the storage can provide services normally and whether the business can run normally. Solutions for monitoring and predicting future performance trends of centralized storage

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Centralized memory monitoring method and device
  • Centralized memory monitoring method and device
  • Centralized memory monitoring method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0053] The invention discloses a centralized memory monitoring method and device, and those skilled in the art can learn from the content of this article and appropriately improve the process parameters to realize it. In particular, it should be pointed out that all similar replacements and modifications are obvious to those skilled in the art, and they are all considered to be included in the present invention. The method and application of the present invention have been described through preferred embodiments, and the relevant personnel can obviously make changes or appropriate changes and combinations to the method and application described herein without departing from the content, spirit and scope of the present invention to realize and Apply the technology of the present invention.

[0054] The technical solutions in the embodiments of the present application will be described below with reference to the drawings in the embodiments of the present application.

[0055] ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a centralized memory monitoring method and device. The method comprises the steps of obtaining performance data of at least one performance index of a centralized memory in a first time period; inputting the performance data of the at least one performance index in the first time period into a preset dynamic baseline model to obtain a first dynamic baseline of the at least one performance index in a second time period output by the preset dynamic baseline model, the second time period being later than the first time period; obtaining performance data of at least one performance index of the centralized memory in the second time period; and comparing the performance data of the at least one performance index in the second time period with the first dynamic baseline, determining whether the at least one performance index is abnormal in the second time period or not according to a comparison result, if the at least one performance index is abnormal in the second time period, generating abnormal information of the at least one performance index, and sending the abnormal information to an alarm platform. Thus, the performance of the centralized memory is monitoredand predicted.

Description

technical field [0001] The invention relates to the field of computers, in particular to a centralized memory monitoring method and device. Background technique [0002] With the development of science and technology, the business volume of centralized storage is increasing, and the storage scale is also increasing. The management of centralized storage has gradually developed from a single unit to multiple units. Management of multiple centralized storage devices provides convenience, but it still cannot meet the needs of efficient operation and maintenance. [0003] This puts forward higher requirements for the management and monitoring of centralized storage. For example, the performance of centralized storage is a key factor affecting whether the storage can provide services normally and whether the business can run normally. A solution for monitoring and predicting future performance trends of centralized storage. Contents of the invention [0004] In view of this, ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/30G06F11/34G06F11/32
CPCG06F11/3037G06F11/3051G06F11/3409G06F11/327Y02D10/00
Inventor 袁未未王延生马晓平邓罡冯汀冯毅张云飞王欣龚文
Owner TRAVELSKY
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com