A reconstruction device and reconstruction method for accurate reconstruction of parallel contours

Abstract

A reconstruction device and reconstruction method for accurate reconstruction of parallel contours, including a linear guide rail arranged between two parallel contours to be measured, a movable carrying platform arranged on the linear guide rail, set on the The rotary platform on the carrying platform, and the table top for setting the displacement sensor on the rotary platform, the table top is provided with 6 displacement sensors, wherein the first to third displacement sensors correspond to a measured profile The fourth to sixth displacement sensors are arranged on the table at equal intervals, and the fourth to sixth displacement sensors are arranged on the table at equal intervals corresponding to the other profile to be measured. The measured contours are adjacent. The invention has the characteristics of high measurement efficiency, convenient operation, accurate measurement, strong versatility, strong stability and on-machine measurement.

Description

technical field [0001] The invention relates to an accurate reconstruction of parallel profiles. In particular, it relates to a reconstruction device and a reconstruction method for accurate reconstruction of parallel contours. Background technique [0002] Precision guide rail is a key part of many instruments and equipment. In many measuring instruments and processing devices, the guide rail is used as the benchmark for measurement and processing, and its straightness will have a great impact on the measurement and processing results. At the same time, when some mechanisms use two parallel guide rails for carrying, the parallelism of the two guide rails is also an important parameter that determines the movement accuracy and stability of the mechanism. Similarly, there are parallel plate structures in many mechanisms, which are used as guides or references. The straightness and parallelism in the plane will have a certain impact on the function of the mechanism. Therefore...

AI Technical Summary

Problems solved by technology

In the STP method, the sensor spacing is the same as the step spacing of the measuring mechanism and the measurement point spacing, and there is no data processing error in the reconstruction results obtained. However, due to the design of the mechanical structure, the measurement point spacing is greatly restricted by the sensor spacing, which makes the reconstruction The measurement points are sparse during the process, which is easy to cause the loss of information

In the GTP method, the sampling distance of the measurement points is smaller than the sensor distance, which solves this problem, but will introduce data processing errors.

The CTP method combines these two methods, and can realize reconstruction without data processing error in the case of high-density sampling, but it needs to assume that there is a completely smooth contour on the measured plane to adjust the relationship between multiple reconstruction curves. Relative position, difficult to achieve in many cases

Compared with the two-point method, the three-point method can eliminate the deviation error while eliminating the straightness error of the measurement reference. However, the zero position error of the sensor will have a greater impact on the measurement results, and there are also high-density sampling and no data. Dealing with Errors Can't Have Both

[0004] For the reconstruction of parallel contours, people have designed some sensor groups placed on the back. In principle, they still use two-point method, three-point method and other measurement methods, so there is also the problem that high-density sampling and no data processing error cannot be achieved at the same time. It also includes the problem that zero position error often has a great influence on the measurement results when measuring with multiple sensors

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