A multi-frequency one-dimensional synthetic aperture microwave radiometer sst deep learning inversion method
A technology of microwave radiometer and synthetic aperture, which is applied in the field of remote sensing, and can solve complex problems such as the inability to apply one-dimensional synthetic aperture microwave radiometer
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0034] In order to make the technical means, creative features, goals and effects achieved by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments.
[0035] Such as Figure 1 to Figure 4 Shown, a kind of SST deep learning inversion method of multi-frequency one-dimensional synthetic aperture microwave radiometer, described method comprises the following steps:
[0036] Step 1: Divide the one-dimensional field of view of the one-dimensional synthetic aperture microwave radiometer into 367 pixels, and the incident angle corresponding to each pixel is between 35°-65°. ×367 grid lattice, assuming that the one-dimensional synthetic aperture microwave radiometer sweeps uniformly over the observation scene, the 367 grid points in each row correspond to the 367 pixels in the field of view of the one-dimensional synthetic aperture microwave radiometer point one-to-one correspondence, each grid point in...
PUM
![No PUM](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/noPUMSmall.5c5f49c7.png)
Abstract
Description
Claims
Application Information
![application no application](https://static-eureka-patsnap-com.libproxy1.nus.edu.sg/ssr/23.2.0/_nuxt/application.06fe782c.png)
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com