Apparatus and method for measuring Seebeck coefficient of material by contrast method

Abstract

The invention relates to an apparatus for measuring the Seebeck coefficient of a material by a contrast method. The device comprises a sample table, a heating power supply and a data acquisition device. The sample table comprises a jig, the jig comprises a lower jig and an upper jig, samples comprise a standard sample and a test sample, the standard sample and the test sample are clamped between the lower jig and the upper jig, and a heating rod is installed in the lower jig. By comparing the test sample with the standard sample, the Seebeck coefficient of the material is measured indirectly,compared with direct measurement, the problem of inaccurate temperature measurement at both ends of the sample is avoided, inaccurate temperature measurement is the biggest error source in Seebeck coefficient measurement, moreover, the system only needs to measure the potential difference between both ends of the test sample and the potential difference between both ends of the standard sample, the temperature on both sides of the samples does not need to be measured, which greatly reduces the signal leads in the system, makes the system more simple and effective, and the problem of thermocouple corrosion in the test process is avoided by using a graphite electrode to make contact with the samples.

Description

technical field [0001] The invention relates to a thermoelectric semiconductor material performance sample stage, in particular to a device and method for measuring the Seebeck coefficient of a material by using a comparison method. Background technique [0002] The Seebeck coefficient is the inherent thermoelectric property of the material. Thermoelectric materials using the Seebeck effect are mainly used to make temperature sensors such as thermocouples, thermoelectric power generation sheets and semiconductor refrigeration sheets. Research and application are of great significance. [0003] The existing measurement device and method are as follows: the test sample is clamped between the sample stages, and the thermocouple probes A and B are in direct contact with the two ends of the sample, so as to measure the temperature of the two contact points and the temperature between the probes A and B. potential difference between them. [0004] The Seebeck coefficient of the ...

AI Technical Summary

Problems solved by technology

[0005] (1) There will be a large error in measuring the surface temperature of the sample by directly contacting the thermocouple with the sample surface, and the existing test device, the inaccurate temperature measurement is the largest source of error in the Seebeck coefficient measurement;

[0006] (2) The thermocouple and the sample will undergo corrosion reaction at high temperature, making the thermocouple invalid and unable to repeat the test

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