Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A Method of Measuring Vertical Line Deviation Based on Static Correction

A technology of vertical line deviation and measurement method, which is applied in radio wave measurement system, measurement device, navigation through speed/acceleration measurement, etc. It can solve the problems of increased time accumulation of heading angle error and insufficient compensation of celestial attitude error.

Active Publication Date: 2020-11-20
SOUTHEAST UNIV
View PDF3 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Purpose of the invention: To provide a method for measuring vertical line deviation based on static correction. This method not only uses speed and position information as observations, but also adds zero angle correction observations to limit the heading angle error by updating the constant zero offset of the angular velocity sensor. Reduce the heading angle drift, aiming to solve the problem that the compensation of the attitude error in the vertical line deviation is not in place and the heading angle error accumulates over time

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A Method of Measuring Vertical Line Deviation Based on Static Correction
  • A Method of Measuring Vertical Line Deviation Based on Static Correction
  • A Method of Measuring Vertical Line Deviation Based on Static Correction

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0079] The technical solution of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0080] A vertical line deviation measurement method based on static correction of the present invention is specifically a method for establishing the attitude, position, velocity equation and measurement equation of the vertical line deviation observation model of the inertial navigation and global positioning inertial navigation and global positioning combined system, aiming at whether the carrier is uniform or not The correction method of the vertical line deviation observation model of the proposed static correction and the establishment method of the corrected static correction vertical line deviation observation model are proposed. This method not only uses speed and position information as observations, but also adds zero-angle correction observations to limit the heading angle error. By updating the constant ze...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a vertical deviation measuring method based on static correction. The vertical deviation measuring method comprises the steps that an attitude, position and velocity equation,and a measuring equation of a combined system vertical deviation observation model are established; a static correction vertical deviation observation model is established; whether a carrier is in uniform motion or not is determined, and if the carrier is in uniform motion, then a position difference and a measured value of course angle correction are used as the measuring equation to correct a vertical deviation equation; otherwise, a velocity, the position difference, and the measured value of course angle correction are used as observations to correct the vertical deviation equation; and inertia system output state variables are statically corrected based on the corrected static correction vertical deviation observation model. According to the vertical deviation measuring method based on static correction, velocity information and position information are used as the observations, in the meantime, zero angle correction observations are added to limit a course angle error, constant zero offset of an angular velocity sensor is updated to reduce the course angle drift, and the problems that southern attitude error compensation during the combined system vertical deviation measuringis not satisfied and the course angle error increases with time are solved.

Description

technical field [0001] The invention relates to a vertical line deviation measurement technology of an inertial navigation and global positioning combined system, in particular to a vertical line deviation measurement method based on static correction. Background technique [0002] Combining global positioning system and inertial system and applying information fusion theory to form an optimal combined measurement system has become the development direction of new measurement technology. They have good complementary characteristics, and can obtain three-dimensional position, velocity, and attitude information with stability, high precision, and high data update rate. In the vertical line deviation combined measurement system, the global positioning system is usually used to output the position and velocity measurement values ​​and the algorithm of recursive filtering is used to limit the accumulation of inertial system errors. However, the position and velocity measurement v...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01C21/16G01S19/47G01S19/52G01S19/53G01S19/40
CPCG01C21/165G01S19/40G01S19/47G01S19/52G01S19/53
Inventor 赵立业沈翔王健松黄丽斌李宏生罗海天
Owner SOUTHEAST UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products