Time counting method of embedded device

An embedded device, time statistics technology, applied in the field of statistics, can solve the problems of unreality, statistics, and invisibility of data, and achieve the effect of real and reliable data

Active Publication Date: 2019-03-19
NINGBO SANXING INTELLIGENT ELECTRIC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The existing technology is realized through the concept of accumulation, using a variable, starting from zero crossing, accumulating 1 every minute; not accumulating during the middle power-off period, and continuing to accumulate after power-on; Skip the time synchronization time and continue to accumulate; in the case of forward time synchronization, the time synchronization time in the middle is repeatedly accumulated, so there will be more accumulation or less accumulation. In the case of forward time synchronization, the statistical minutes of a day exceed 1440 Minutes, the data will be considered untrue; and the number of minutes cannot be counted in segments or intervals, it can only be counted according to the whole day, or the number of minutes of the current day or the current month so far, and which accumulated minutes are not visible, Therefore, further improvement is required

Method used

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Examples

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Embodiment Construction

[0027] The following examples describe the present invention in further detail.

[0028] A time statistics method for an embedded device, particularly involving the following steps:

[0029] Step 1. Establish a time matrix A of a day, where

[0030] Among them, a i,j Indicates whether the embedded device has been monitored and counted at the j-1 point at the i-1 time; 1≤i≤m, 1≤j≤n; a i,j = 1 means that the embedded device has carried out monitoring statistics at the j-1th point at the i-1 time; a i,j =0 means that the embedded device has not performed monitoring statistics at the j-1th point at the i-1th time; in this embodiment, m=24, n=60;

[0031] The specific method of step 1 is: when the clock of the embedded device is in normal time, the embedded device will monitor and count once every minute, and set the element of the normal monitoring time of the embedded device in the time matrix A of the day to 1; when the embedded device When the device clock is abnormally t...

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PUM

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Abstract

The invention relates to a time counting method of an embedded device. The method is characterized by including the following steps of firstly, establishing a time matrix X in one day, and representing the counting situation of the embedded device through numbers in the time matrix A in one day; secondly, establishing a minute counting matrix F, and setting a minute time duration needing to be counted of the embedded device; thirdly, calculating an hour matrix H, wherein H=A*F, and the minute numbers counted in each hour by the embedded device are obtained; fourthly, establishing an hour counting matrix T, and setting an hour time duration needing to be counted of the embedded device; fifthly, calculating a time matrix C in one day, wherein C=T*H, and the minute numbers counted in the timeduration selected by the embedded device in one day are obtained. The method has the advantages that the time duration is freely selected through the minute counting matrix and the hour counting matrix, and the minute number counted in the time duration selected by the embedded device in one day is calculated through the matrixes.

Description

technical field [0001] The invention relates to the field of statistics, in particular to a time statistics method for embedded devices. Background technique [0002] Embedded devices need to have the function of counting the voltage qualification rate and voltage exceeding the limit on a daily basis. The voltage qualification rate refers to the percentage of the sum of the time when the voltage of the monitoring point is within the qualified range and the total monthly voltage monitoring time during the operation of the power grid within a month. Voltage limit refers to the rate of voltage exceeding the upper limit and the rate of voltage exceeding the lower limit. The rate of voltage exceeding the upper limit is the percentage of the cumulative time of statistical voltage exceeding the upper limit and the total monitoring time. The rate of voltage exceeding the lower limit is the cumulative time of statistical voltage exceeding the lower limit and the total monitoring time....

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R19/17G01R19/165G06F17/16
CPCG01R19/16576G01R19/17G06F17/16
Inventor 王培慧
Owner NINGBO SANXING INTELLIGENT ELECTRIC
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