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Image Brightness Correction Method Based on Nanoparticle SEM Image Brightness Extraction

A nanoparticle and image brightness technology, which is applied in image enhancement, image data processing, instruments, etc., can solve the problems of uneven brightness of nanoparticle SEM image and inability to interpolate the boundary part of nanoparticle SEM image

Active Publication Date: 2021-01-26
HEBEI UNIV OF TECH +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide an image brightness correction method based on nanoparticle SEM image brightness extraction, the method is based on the overall brightness extraction of nanoparticle SEM images and then corrects the uneven brightness of all regions of the image, especially It shows the average brightness of each pixel in the nanoparticle SEM image when a certain boundary area in the nanoparticle SEM image has high brightness, while the other boundary area has a darker brightness, and realizes the nanoparticle SEM image. The uniform brightness of the entire area of ​​the image overcomes the fact that the high brightness and dark brightness in the nanoparticle SEM image often appear in different peripheral boundaries of the image, and the existing technology cannot realize the interpolation of the surrounding boundary of the nanoparticle SEM image, resulting in the obtained Inhomogeneous Brightness Defects of SEM Images of Nanoparticles

Method used

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  • Image Brightness Correction Method Based on Nanoparticle SEM Image Brightness Extraction
  • Image Brightness Correction Method Based on Nanoparticle SEM Image Brightness Extraction
  • Image Brightness Correction Method Based on Nanoparticle SEM Image Brightness Extraction

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Embodiment 1

[0178] The first step is to divide the nanoparticle SEM image with uneven brightness into M′N blocks:

[0179] Nanoparticle SEM images are denoted by P,

[0180] Divide the nanoparticle SEM image with uneven brightness into vertical M=4 equal parts and horizontal N=6 equal parts, a total of 4′6 blocks, except for the borders of adjacent blocks, there is no difference between blocks and blocks. overlapping, in each block,

[0181] There are m=100 pixels in the vertical direction and n=100 pixels in the horizontal direction, corresponding to the vertical 4'100 pixels and the horizontal 6'100 pixels of the entire nanoparticle SEM image P, the actual distance corresponding to the pixels is used to calculate the nanoparticle SEM image P and The actual size of each block, the number of pixels to be covered in a single block area is ≥ 10 nanoparticles, and the vertical and horizontal SEM images of nanoparticles with uneven brightness contain at least 3 block areas, each block The h...

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Abstract

The invention discloses an image brightness correction method based on nanoparticle SEM image brightness extraction and relates to general image data processing; According to the method, overall brightness extraction is carried out based on a nano-particle SEM image so as to correct non-uniform brightness of all areas of the image; particularly, a certain boundary part region in the nanoparticle SEM image has high brightness; under the condition that darker brightness appears in the other boundary part region, the brightness is improved; the average brightness of each pixel point of the nanoparticle SEM image is displayed; brightness uniformization of all areas of the nanoparticle SEM image is realized; The defect that the brightness of the obtained nano-particle SEM image is not uniform due to the fact that high brightness and dark brightness often appear on different peripheral boundaries of the image respectively, and interpolation of the peripheral boundary parts of the nano-particle SEM image cannot be achieved in the prior art is overcome.

Description

technical field [0001] The technical solution of the present invention relates to general image data processing, specifically to an image brightness correction method based on nanoparticle SEM image brightness extraction. Background technique [0002] The electron beam in the scanning electron microscope (Scanning Electron Microscope, hereinafter referred to as SEM) is accelerated by voltage, converged by magnetic lens and scanned coil, and uses secondary electron signal imaging to observe the surface morphology of the sample, which has reached nanoscale Ultra-high resolution is widely used in the field of microscopic research in many disciplines of medicine, biology and materials. [0003] Due to the long-term work of the electron microscope, the filament shifts and swings, resulting in uneven reflection of the current, and the micro-tilt of the stage is not firm, resulting in inconsistent receiving and emitting currents of the sample. The currently acquired SEM images will...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/00
CPCG06T5/007
Inventor 赵红东李宇海孙梅H.S.艾哈迈德王储赵泽通张洁闫苗
Owner HEBEI UNIV OF TECH
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