An image brightness correction method based on nanoparticle SEM image brightness extraction

Abstract

The invention discloses an image brightness correction method based on nanoparticle SEM image brightness extraction and relates to general image data processing; According to the method, overall brightness extraction is carried out based on a nano-particle SEM image so as to correct non-uniform brightness of all areas of the image; particularly, a certain boundary part region in the nanoparticle SEM image has high brightness; under the condition that darker brightness appears in the other boundary part region, the brightness is improved; the average brightness of each pixel point of the nanoparticle SEM image is displayed; brightness uniformization of all areas of the nanoparticle SEM image is realized; The defect that the brightness of the obtained nano-particle SEM image is not uniform due to the fact that high brightness and dark brightness often appear on different peripheral boundaries of the image respectively, and interpolation of the peripheral boundary parts of the nano-particle SEM image cannot be achieved in the prior art is overcome.

Description

technical field [0001] The technical solution of the present invention relates to general image data processing, specifically to an image brightness correction method based on nanoparticle SEM image brightness extraction. Background technique [0002] The electron beam in the scanning electron microscope (Scanning Electron Microscope, hereinafter referred to as SEM) is accelerated by voltage, converged by magnetic lens and scanned coil, and uses secondary electron signal imaging to observe the surface morphology of the sample, which has reached nanoscale Ultra-high resolution is widely used in the field of microscopic research in many disciplines of medicine, biology and materials. [0003] Due to the long-term work of the electron microscope, the filament shifts and swings, resulting in uneven reflection of the current, and the micro-tilt of the stage is not firm, resulting in inconsistent receiving and emitting currents of the sample. The currently acquired SEM images will...

AI Technical Summary

Problems solved by technology

[0005] The technical problem to be solved by the present invention is to provide an image brightness correction method based on nanoparticle SEM image brightness extraction, the method is based on the overall brightness extraction of nanoparticle SEM images and then corrects the uneven brightness of all regions of the image, especially It shows the average brightness of each pixel in the nanoparticle SEM image when a certain boundary area in the nanoparticle SEM image has high brightness, while the other boundary area has a darker brightness, and realizes the nanoparticle SEM image. The uniform brightness of the entire area of ​​the image overcomes the fact that the high brightness and dark brightness in the nanoparticle SEM image often appear in different peripheral boundaries of the image, and the existing technology cannot realize the interpolation of the surrounding boundary of the nanoparticle SEM image, resulting in the obtained Inhomogeneous Brightness Defects of SEM Images of Nanoparticles

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