Method and device for determining incident angle of terahertz wave reflection measurement system

Abstract

The invention relates to a method for determining an incident angle of a terahertz wave reflection measurement system. The method comprises the following steps of: obtaining a first calibration plateand a second calibration plate by a terahertz wave transmission measurement, wherein the first calibration plate is taken as the electric field intensity of the terahertz wave transmission of a sampleto be measured, and the second calibration plate is taken as the electric field intensity of the terahertz wave transmission when no sample is measured, so as to obtain complex refractive indexes ofthe first calibration plate and the second calibration plate; at a certain incident angle, obtaining the electric field intensities of the terahertz wave reflection separately reflected by the first calibration plate and the second calibration plate by a terahertz wave reflection measurement; separately solving reflection coefficient expressions of the two according to the complex refractive indexes of the first calibration plate and the second calibration plate, and the Fresnel formula; and calculating the incident angle of the terahertz wave reflection measurement system by combining the ratio of the electric field intensities of the terahertz wave reflection reflected by the two. The invention further relates to a device for determining the incident angle of the terahertz wave reflection measurement system. According to the method and the device, the problem that an angle measuring instrument in the prior art cannot accurately determine the incident angle is solved by accurately calculating the incident angle of the terahertz wave reflection measurement system.

Description

technical field [0001] The invention relates to the field of terahertz technology, in particular to a method and device for determining the incident angle of a terahertz wave reflection measurement system. Background technique [0002] Terahertz pulses generally refer to electromagnetic waves with wavelengths from 30 micrometers to 3 millimeters and frequencies from 0.1 to 10 terahertz. Terahertz pulses lie between infrared and millimeter waves and have a fairly wide spectrum. Because terahertz pulses are in the transition region between photonics and electronics, it can provide information that traditional detection methods such as visible light or microwaves cannot provide, so it has great application prospects in the fields of physics, chemistry and biomedicine. [0003] At present, the terahertz wave reflection measurement system usually relies on the reading of the external goniometer to obtain the incident angle of the terahertz wave reflection measurement. This metho...

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to solve the problem that the prior art relies on manual reading of the goniometer to obtain the incidence angle accuracy of the terahertz wave reflection measurement, which is prone to deviation.

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