Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

A large-area dynamic measurement device and method for the preparation process of nano-films

A nano-film, preparation process technology, applied in the field of optical measurement, can solve problems such as the inability to achieve dynamic measurement

Active Publication Date: 2019-06-11
HUAZHONG UNIV OF SCI & TECH
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, limited by the time-consuming beam polarization state modulation method adopted, the single measurement time of this device exceeds several seconds, which cannot realize the dynamic measurement of the polymerization reaction and particle molecular diffusion process in the preparation process of nanomaterials.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • A large-area dynamic measurement device and method for the preparation process of nano-films
  • A large-area dynamic measurement device and method for the preparation process of nano-films
  • A large-area dynamic measurement device and method for the preparation process of nano-films

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0043] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0044] Such as figure 1 As shown, the embodiment of the present invention provides a large-area dynamic measurement device for the preparation process of a nanometer thin film, which includes an incident optical path unit and a reflected optical path unit, wherein the incident optical path unit includes a laser light source 10, a beam expander group 20, a mirror 30. The first 1 / 4 wave plate 40,...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of optical measurement, and discloses a large-area dynamic measurement device and a large-area dynamic measurement method in the preparation process of a nano-film. The device comprises an incident light path unit and a reflection light path unit. The incident light path unit is used for providing parallel light beams. The parallel light beams pass through a beam expanding lens group, a reflector, a 1 / 4 wave plate, a polarization beam splitter and another 1 / 4 wave plate to be irradiated on the surface of the nano-film and then reflected by the surface of the nano-film. The reflected light beams are divided into three light beams through two beam splitters. The first light beam is subjected to the 1 / 4 wave plate and the polarization beam splitterto be split into two light beams. After that, the two light beams are measured by two imaging modules and then two light intensity values are obtained. The second light beam is subjected to a 1 / 2 wave plate and the polarization beam splitter to be split into two light beams. After that, the two light beams are measured by two imaging modules and then two light intensity values are obtained. The third light beam is subjected to a fourth polarization beam splitter to be split into two light beams. After that, the two light beams are measured by two imaging modules and then two light intensity values are obtained. According to the obtained six light intensity values, a stokes vector is calculated and the least square fitting is performed to extract a to-be-measured parameter. Therefore, thedynamic observation of the preparation process of the nano-film is realized. The device is convenient and reliable in measurement and strong in applicability.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, and more specifically relates to a large-area dynamic measurement device and method in the preparation process of a nanometer thin film. Background technique [0002] The holographic polymer film prepared by photopolymerization in the nano film not only has the advantages of high photosensitive sensitivity and easy processing, but also has excellent data repeatable recording characteristics and information storage stability, so it is widely used in the preparation of holographic data storage media . The preparation mechanism of this kind of holographic polymer film is mainly: taking "organic-inorganic" nanocomposite photopolymerization film as an example, the spatially non-uniform illumination light generates free radicals through the separation of initiators; Molecules react in the bright area and cause chain polymerization of monomer molecules; this polymerization reaction will red...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/30
CPCG01B11/30
Inventor 江浩刘佳敏刘世元钟志成谷洪刚张传维陈修国
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products