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Sample fixing device for high temperature tribometer

A technology of friction and wear testing and fixing devices, which is applied to measuring devices, testing wear resistance, instruments, etc., can solve the problems of uncertain material performance, increased difficulty, cracking, etc., and achieves simple operation, wide application range, and improved experimental results. efficiency effect

Inactive Publication Date: 2017-11-24
JIANGSU UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the existing high-temperature friction and wear testing machine needs to process and locate the sample before the test. Generally, two small holes are drilled on the bottom surface of the sample and fixed by two positioning pins on the lower sub-disk of the testing machine. The size and size of the sample are limited, but the experimental materials are very complex, some materials are difficult to process, and some materials have uncertain properties. When drilling, problems such as cracking may occur. At the same time, the preparation of the sample The cumbersomeness also increases the difficulty of the experiment

Method used

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  • Sample fixing device for high temperature tribometer
  • Sample fixing device for high temperature tribometer
  • Sample fixing device for high temperature tribometer

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Embodiment Construction

[0022] In order to make the technical solutions of the present invention clearer and clearer to those skilled in the art, the present invention will be further described in detail below in conjunction with the examples and accompanying drawings, but the embodiments of the present invention are not limited thereto.

[0023] like figure 1 , figure 2 , image 3 , Figure 4 and Figure 5 As shown, the sample fixing device of a high-temperature friction and wear testing machine provided in this embodiment includes a base 1 and a plurality of fixing devices arranged on the base 1, and the upper part of the base 1 is symmetrically provided with a plurality of Fixing groove 2 and a plurality of fixing holes 3, all are provided with limiting groove 5 in each described fixing groove 2, each described fixing device is separately arranged on a described fixing groove 2 respectively, each described fixing device Including a long nut 7, a V-shaped fixing piece 8, a square fixing piece ...

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Abstract

The invention discloses a sample fixing device for a high temperature tribometer. The sample fixing device comprises a base and a plurality of fixing devices arranged on the base, wherein a plurality of fixing grooves and a plurality of fixing holes are symmetrically formed in the upper part of the base; a limiting groove is formed in each fixing groove; each fixing device is arranged on one fixing groove; each fixing device comprises a long nut, a V-shaped fixing part, a square fixing part and a large bolt; each V-shaped fixing part and the corresponding square fixing part are arranged on the corresponding long nut; each large bolt is arranged at the end part of the corresponding long nut; the plurality of V-shaped fixing parts are used for clamping circular samples; the fixing grooves and the limiting grooves are used for limiting the V-shaped fixing parts and the square fixing parts; each V-shaped fixing part consists of a fixing block, a connecting body and a limiting boss; each limiting boss is matched with the corresponding limiting groove; each connecting body is matched with the corresponding fixing groove. The sample fixing device disclosed by the invention is simple in operation and wide in application range; the experiment efficiency can be substantially improved.

Description

technical field [0001] The invention relates to a fixing device, in particular to a sample fixing device of a high-temperature friction and wear testing machine, and belongs to the technical field of high-temperature friction and wear testing. Background technique [0002] At present, the existing high-temperature friction and wear testing machine needs to process and locate the sample before the test. Generally, two small holes are drilled on the bottom surface of the sample and fixed by two positioning pins on the lower sub-disk of the testing machine. The size and size of the sample are limited, but the experimental materials are very complex, some materials are difficult to process, and some materials have uncertain properties. When drilling, problems such as cracking may occur. At the same time, the preparation of the sample The cumbersomeness also increases the difficulty of the experiment. Contents of the invention [0003] The main purpose of the present invention...

Claims

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Application Information

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IPC IPC(8): G01N3/02G01N3/56
CPCG01N3/02G01N3/56G01N2203/0226G01N2203/04
Inventor 李小平张明王康
Owner JIANGSU UNIV OF TECH
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