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Bayesian reliability evaluation method of performance degradation test based on inverse Gaussian process

An inverse Gaussian, reliable technology, applied in special data processing applications, instruments, electrical and digital data processing, etc., can solve problems such as neglect, and achieve the effect of good fitting data, extended acquisition, and accurate evaluation results.

Active Publication Date: 2017-09-29
SHANGHAI RADIO EQUIP RES INST
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AI Technical Summary

Problems solved by technology

On the other hand, for complex high-reliability products, there are often multiple development stages with high inheritance, and the performance degradation information of the test pieces at each stage of development can help to evaluate the reliability of the final product to a large extent, that is, the reliability of the original product. Reliability, however, traditional performance degradation test analysis often ignores this valuable information

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  • Bayesian reliability evaluation method of performance degradation test based on inverse Gaussian process
  • Bayesian reliability evaluation method of performance degradation test based on inverse Gaussian process
  • Bayesian reliability evaluation method of performance degradation test based on inverse Gaussian process

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Embodiment Construction

[0056] The following combination figure 1 , a preferred embodiment of the present invention is described in detail.

[0057] like figure 1 As shown, the performance degradation test Bayesian reliability evaluation method based on the inverse Gaussian process provided by the present invention comprises the following steps:

[0058] S1. Establish an inverse Gaussian process degradation statistical model, and determine the expressions of the reliability function and the average failure time;

[0059] S2. Collect performance degradation data of test pieces in each stage of product development;

[0060] S3. Conversion of the obtained performance degradation data of the test piece to the performance degradation data of the normal product under normal working stress, as prior information for Bayesian reliability estimation;

[0061] S4. Using the performance degradation data of the positive product as the posterior information of Bayesian reliability estimation, combined with the ...

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Abstract

The invention relates to a Bayesian reliability evaluation method of a performance degradation test based on the inverse Gaussian process. The method comprises the steps that S1, a degradation statistical model of the inverse Gaussian process is established, and a reliability function and the mean failure time are determined; S2, performance degradation data of a test piece at each stage of the development of a product is collected; S3, the performance degradation data of the test piece is converted to the performance degradation data of a normal product under a normal working stress and used as the prior information of Bayesian reliability estimation; S4, the performance degradation data of the normal product is used as the posterior information and combined with the prior information, parameters for calculating a reliability function are obtained; S5, the reliability function and the mean failure time are calculated, and Bayesian estimation results of product reliability are obtained. The inverse Gaussian model is adopted to depict the degradation process of the product performance, and data can be better fitted; the performance degradation data of the test piece at each stage of the development is incorporated into the scope of the prior information of Bayesian estimation, and the product Bayesian reliability evaluation results are more accurate and more comprehensive.

Description

technical field [0001] The invention relates to a performance degradation test Bayesian reliability evaluation technology for high-reliability and long-life products, specifically a performance degradation test Bayesian reliability evaluation method based on an inverse Gaussian process, which belongs to performance degradation test analysis, Reliability assessment technical field. Background technique [0002] With the development of technology, the reliability of products is getting higher and higher, and the lifespan is getting longer and longer. Therefore, it is becoming more and more difficult to evaluate the reliability of products by using traditional life tests. However, the function of a product is dynamically characterized by its physical or chemical performance parameters, and there is an inevitable connection between failure and performance degradation. to make a more accurate assessment of reliability. [0003] For the reliability evaluation of performance degr...

Claims

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Application Information

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IPC IPC(8): G06F19/00
CPCG16Z99/00
Inventor 李鸿志周郁黄勇张衡李雁斌张志俊
Owner SHANGHAI RADIO EQUIP RES INST
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